200mm Probe Stations
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Probe Systems Planning
Cascade Microtech’s industry standard 200 mm wafer probing systems are in use at virtually all leading semiconductor manufacturing and design sites worldwide. They have been designed to allow access the full measurement range of today’s most advanced test instrumentation. Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
PM8 Manual Probe System
The PM8 Analytical Prober is the benchmark in manual failure analysis and in-process testing. This modular system meets customers' needs for precision, reliability and cost of ownership.
Wafer size: ≤ 200 mm
Main Applications: DCM, FA [View more]
Summit Semi-automatic Probe System
The Summit series 200 mm semi-automatic probe systems lead the industry in on-wafer measurements. Whatever your application: RF/Microwave, device characterization, wafer-level reliability, e-test, modeling or yield enhancement, the Summit meets your unique wafer probing test requirements. [View more]
PA200 Semi-automatic Probe System
The PA200 semi-automatic probe station relies on precision engineering to provide a stable environment for the most exacting applications.
Wafer size: ≤ 200mm
Main Applications: DCM, FA [View more]
BlueRay Series Production Test Probe Systems
The BlueRay™ probe systems ensure accurate and repeatable test results for wafer-level functional test of discrete devices. The PA200 BlueRay semi-automatic probe system can be easily upgradeable in the field to a fully-automatic system, AP200 BlueRay, by simply docking a wafer-handling robot. [View more]
