Cascade Microtech is a worldwide leader in the precision electrical measurement and test of advanced semiconductor devices - integrated circuits (ICs), chips, circuit boards, modules, MEMS, 3D TSV, LED devices and more. Our engineering probe stations and analytical probes are used in research and development for precise electrical measurements on complex, high-speed devices, to assure quality and reliability and to reduce the time and cost of device fabrication processes. Our leading-edge production test products include unique probe cards, test sockets and ATE contactors that reduce manufacturing costs of high-speed and high-density semiconductor chips.

Each of the 20 largest semiconductor manufacturers in the world is one of our more than 800 customers. They use our products to perform engineering and production test of a wide variety of devices - digital signal processors, telecommunications chips, advanced memory chips, microprocessors, microcontrollers, graphics processors and application specific integrated circuits. Our precision measurement capability enables semiconductor companies around the world to keep up with the Moore's Law and to deliver their products to market faster and cheaper.

A History of Innovation

Cascade Microtech began with the teamwork of Eric Strid and Reed Gleason, who in 1983 developed the first microwave wafer probe. Before 1983, high-speed IC designers could only speculate as to why a particular design worked. The true electrical performance of these microwave circuits was impossible to measure at the wafer level. By using Cascade Microtech's revolutionary on-wafer probing solutions, design engineers could actually test and characterize circuits at the wafer level, before the ICs were diced and packaged. This halved research and development times and lowered the tremendous cost of developing new chips. Cascade Microtech's on-wafer probing technology has since become an industry standard.