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Aug 18 2010 Cascade Microtech Welcomes Ellen Raim as Vice President of Human Resources
“We are extremely pleased to have Ellen join our executive team,” said Michael Burger, president and CEO of Cascade Microtech, Inc. “As we rapidly expand around the world, the ability to recruit and develop our talent on a global basis is key to our future. View more
Aug 18 2010 Cascade Microtech Appoints New Board Member
Cascade Microtech, Inc. has elected Dr. John Y. Chen to its Board of Directors effective August 13, 2010. View more
For a complete list of events click here.
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC)
Feria Valencia, Valencia, Spain
Poster Presentation
Si-wafer based PV modules consist of many single solar cells. The best match of these cells within the module guarantees the maximum output, because the worst cell is essential for the overall behaviour of the module. Exact and repeatable classification of the solar cells is the basis for the availability of the maximum power, having been produced, until the cells having reached the roof.
While being tested, the cells have reached maximum value in the cell production chain. Therefore the loss of cells by damaging them in this step causes the biggest waste of value. How to improve the critical final test process of the cell and possibly other electrical test steps during cell production will be discussed.
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Free WinCal XE Demo Available!
Request a 30-day trial of WinCal XE by completing our online request form or calling our Sales Department at 1-800-550-3279 (1-503-601-1000) and requesting part number: 142-173.
Learn more about WinCal XE
Unity Probe
The Unity probe is well-suited for on-wafer circuit measurements for engineering design debug and verification. This build-to-order multicontact probe streamlines RFIC engineering test, saving you time, aggravation and money.
Tesla: On-Wafer Power Device Characterization System
The Tesla on-wafer power device characterization system is now fully compatible with the recently released Agilent B1505A power device analyzer. The combined solution offers the industry's highest voltage and current range for on-wafer measurements up to 1500V triax / 3000V coax, and 60A pulsed / 10A DC, to accommodate low noise probing of power devices. The Tesla system meets the requirements of more advanced device characterization applications in automotive, mobile devices, transportation and power manufacturing.
EDGE: Fully Integrated Flicker Noise Measurement System
The EDGE™ Flicker Noise Measurement System is the world's only integrated, noise-immune measurement system that certifies accurate flicker noise measurements from 1 Hz to 30 MHz. For the first time ever, R&D engineers, technicians and lab managers who need to measure flicker noise for device modeling or process development can enjoy extraordinarily simple access to flicker noise data over the widest frequency range, with the lowest background noise.
Engineering Probe Selection Guide - Cascade Microtech offers a wide selection of engineering probes to meet the highly demanding and broad range of on-wafer and signal integrity applications. Our families of RF, mixed-signal and DC probes are designed to meet the many challenges of the var ...
Probe Station Accessory Catalog - Cascade Microtech's Probe Station Accessory Catalog is a 'full text searchable' reference catalog which provides descriptive detail, graphics and order information. ...
