PDC50
World's first 45 nm capable DC parametric probe card
The PDC50 DC Parametric Pyramid Probe Cards enable the accurate monitoring of 65nm and 45nm parametric test structures, delivering superior signal integrity and faster settling time. Learn More
GRYPHICS TEST SOCKETS
Medium to high-volume, high-density, small-pitch, Gigahertz interconnection systems
Latest News
April 29, 2008 Cascade Microtech Reports First Quarter 2008 Results
February 12, 2008 Cascade Microtech Reports Fourth Quarter and 2007 Year End Results
Special Offers!
Board Test Systems
Affordable and complete horizontal and vertical board test systems, enabling precision electrical measurements of IC packages and circuit boards.
About Cascade Microtech
Cascade Microtech is a worldwide leader in the precise electrical measurement of ICs and other small structures.
