Jun. 11, 2013 :: EXTERNAL NEWS Cascade Microtech ranked #4 in "Best of Northwest"Performance last two years strong – lands company at No. 4 in The Seattle Times’ 22nd annual ranking of public companies based in the Northwest.
May. 20, 2013 :: NEWS Cascade Microtech Goes Global with CONNECT 2013
Apr. 30, 2013 :: NEWS Cascade Microtech Reports First Quarter 2013 Results
Apr. 23, 2013 :: NEWS Cascade Microtech to Announce First Quarter Results on April 30, 2013
Danube Integrated Circuit Engineering (DICE), a radar IC manufacturer in Austria, makes mmW receiver/transmitter ICs for automotive collision avoidance radar applications. These devices have close to 100 connections surrounding a 5 mm2 die, with up to 25 mixed-signal contacts per side, limiting the size of the pads to 80 μm x 80 μm. Read our case study and learn how DICE overcame testing challenges and reduced test times by 50% using InfinityQuad probes. [Download]
Pushing device operation frequencies towards the sub-THz range causes serious challenges for conventional device characterization techniques. This application note presents a comparison of SOLT, NIST multiline TRL, and LRRM probe-tip calibration methods for accuracy of measured and extracted figure of merits (FoM) of advanced BiCMOS HBT. A good understanding of possible sources of errors and potential room for improvement at each step are key to increasing the accuracy of device characterization. This paper will show why eLRRM is recommended as an accurate, consistent and easy to implement probe tip calibration method for characterization of advanced high-performance active devices.
The calibration solution presented in this document is focused on InfinityQuad™ probes, where the probes are assumed in all four quadrants of the device under test (DUT). It is shown that the proposed N+1-port SOLT/SOLR calibration can calibrate an N-port network of the InfinityQuad placed in four quadrants, using a standardized calibration procedure and standard calibration substrates that are commonly available. Although the inconsistency of the delay can cause measurement uncertainty, it is shown that their effects are likely to be minimal in most practical applications.
Cascade Microtech’s CM300 is a flexible on-wafer measurement platform that scales to meet evolving needs in capability and automation. It enhances device and process characterization and modeling by capturing the true electrical performance of devices and enabling hands-off productivity. With the new Velox™ probe station control software, the CM300 enables safe and fast wafer loading and easy test automation and measurement system integration, while preventing damage of probe tips, probe cards and customer wafers throughout the entire measurement cycle. Read more ...
Cascade Microtech has recently launched XpressQuote, an online tool for RF probes. Locate the correct single- or dual-signal RF probe from a database of over 2,300 RF probes in the Cascade Microtech catalog, and receive pricing and quotes instantly.
In recent years, high-energy standards set by government agencies around the world have rapidly increased the demand for power devices. This increasing demand for high-power devices and the need for lower cost systems put tremendous pressure on device manufacturers to keep up with production. One of the major issues that power device manufacturers are facing is the need to increase throughput of power device tests. The APS200TESLA, a fully-automatic on-wafer probe station, is the industry’s first dedicated test system for high-power device manufacturing. The APS200TESLA ensures accurate production test up to 10.5 kV/400 A, while providing a regulatory-certified safe testing environment. The APS200TESLA significantly improves productivity and throughput during production test of high-power devices, increasing margins and reducing time-to-market. Read more ...
Achieve accurate measurement results in the shortest time – with maximum confidence. Based on the MPS150 manual probe station, Cascade Microtech offers pre-configured probing packages, dedicated for specific applications such as I-V/C-V measurements, failure analysis, RF, mmW and sub-THz, as well as power device characterization. Designed for convenience and ease of operation, these systems are ready to start saving you time and money... right out of the box. Read more ...