High Performance Probe Systems
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Probe Systems Planning
Whether you need a cost-effective manual station for probing 150mm wafers or a semiautomatic thermal station to probe 200mm or 300mm wafers, Cascade Microtech offers a complete line of high-performance solutions for on-wafer probing, circuit boards and modules, vertical probe cards, MEMS, electro-optic devices and more. Probe stations are available with accessories such as thermal control systems, special cables, calibration software, and industry-leading probes that help you position, calibrate, and characterize your device under test. Cascade Microtech pioneered the first 1 femtoamp measurement, and offers systems that probe up to 220 GHz with extremely low leakage and low contact resistance.
150mm Probe Stations
The MPS150 is a very cost-effective and easy to use, yet highly-precise manual probe system for wafers and substrates up to 150 mm. With its modular design, it supports a wide variety of applications such as I-V/C-V, RF, mm-Wave and sub-THz measurements, device characterization, failure analysis (FA), submicron probing, wafer-level reliability (WLR), MEMS, optoelectronic engineering tests and more. [View more]
200mm Probe Stations
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech's 200 mm wafer probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices. [View more]
300mm Probe Stations
Cascade Microtech 300 mm probing solutions set the standard for on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements. [View more]
Dedicated Measurement Systems
Integrated systems from Cascade Microtech provide a complete solution for complex measurement problems that cannot be solved with just a collection of piece parts. Each part of the integrated solution is optimized and fine tuned to work together, enabling fast accurate on-wafer data collection for complex application and measurement needs. [View more]
Probe System Accessories
Precision measurement capability does not end with the probe and probe station. We offer a complete set of accessories to allow you to position, navigate, determine signal fidelity, and contact the wafer or device under test. [View more]