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High Performance Probe Systems
Whether you need a cost-effective manual station for probing 150mm wafers or a semiautomatic thermal station to probe 200mm or 300mm wafers, Cascade Microtech offers a complete line of high-performance solutions for on-wafer probing, circuit boards and modules, vertical probe cards, MEMS, electro-optic devices and more. Probe stations are available with accessories such as thermal control systems, special cables, calibration software, and industry-leading probes. [View more]
Probes
Cascade Microtech offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF microwave probes in the Infinity, Air Coplanar and |Z| Probe families, DCPs for DC test and PE5s for failure analysis. Our probes support a broad range of probing uses at frequencies up to 325 GHz. [View more]
Pyramid Probe Cards
Pyramid Probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Its industry-leading signal integrity and mechanical alignment capabilities make these probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SoCs, and leading edge DC and RF parametric testing. [View more]
