Semiautomatic Probe Systems
The semiautomatic probe stations from SUSS are renowned for their application flexibility and cost of ownership. The PA200 and PA300 can be fully customized with your choice of microscope and all SUSS accessories. The BlueRay™ Probe System is a unique prober that guarantees the highest throughputs for pilot production probing of optoelectronic (LED), passive RF (SAW/BAW/FBAR) and MEMS (especially pressure sensors) devices. Each wafer prober is outfitted with the powerful, Linux-based ProberBench™ control system.PA200 Semiautomatic Probe System
The PA200 semiautomatic probe station has long been regarded as the best analytical probing solution available. The probe system relies on precision engineering to provide a stable environment for the most exacting applications.
Wafer size: ≤ 200mm
Main Applications: DCM, FA
The BlueRay™ Probe System
Setting a new standard for high-speed accuracy, the BlueRay™ probe station is precisely the solution you need for wafer-level functional test of discrete devices.
High-Throughput Production Test System
Wafer size: ≤ 200mm
Main Applications: PT
PA300: Semiautomatic Probe System
For a complete wafer-level test solution, the PA300 can be configured with the vast array of accessories to meet exactly your testing requirements.
Wafer size: ≤ 300mm
Main Applications: DCM, FA
