Manual Probe Systems
The family of manual wafer probers from SUSS are renowned for their ergonomics and flexibility - perfect for any application from failure analysis to device characterization and modeling from DC to 325 GHz and beyond. Choose between our fully-customizable manual probing solutions and our all-in-one package solutions.PM5: 150 mm Manual Probe System
The PM5 Analytical Probe System is intended for cost-effective and precision analysis of wafers and substrates up to 150 mm. High application flexibility is guaranteed with the PM5, which is suitable for the whole spectrum of DC and HF measurements.
Wafer size: ≤ 150 mm
Main Applications: DCM, FA
PM8: The Benchmark in 200mm Manual Probing
The PM8 Analytical Prober is the benchmark in manual failure analysis and in-process testing. This modular system meets customers' needs for precision, reliability and cost of ownership.
Wafer size: ≤ 200 mm
Main Applications: DCM, FA
PM300: Precise & Stable 300mm Probing
The PM300 Analytical Probe System is the industry benchmark in manual semiconductor failure analysis and in-process testing. Its versatility meets a wide range of probing applications.
Wafer size: ≤ 300 mm
Main Applications: DCM, FA
EP6 RF Probing Package
The EP6 RF probing package is designed to give you a cost-effective solution for highly-accurate S-parameter measurements. The package includes the renowned, long-life |Z| Probes®, SussCal® Professional calibration software and a CSR calibration substrate. This ensures high measurement accuracy and repeatability.
Wafer size: ≤ 150 mm
Main Applications: RF Test
EP6 DC Probing Package
The EP6 DC probing package is designed to give you a cost-effective solution for highly-accurate DC measurements such as simple I-V and C-V measurements as well as on-wafer failure analysis.
Wafer size: ≤ 150 mm
Main Applications: DC Test
