Multiple configurations for functional circuit testing

Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade needles for low noise and high performance.

Features

• Customized to customer application
• Mixture of DC and RF in one probe module
• Up to 3 RF
• Up to 8 DC
• Utilizes ACP tip design, GSG, GS or SG
• RF tips available from DC to 100 GHz
• Choice of BeCu or tungsten tips
• DC needles come with a 100 pF capacitor to ground at the needle base

Advantages

• Ideal for probing the entire circuit for functional test
• Dual ACP configuration supports differential signaling applications
• DC probes can provide power or slow logic to circuit under test

40/80 Gb/s High Performance RF Quadrant

Designed to provide wide bandwidth RF connections and simultaneous resonant free power bypass connections for the special needs of high-speed mixed mode IC s for optical networks.

• Low RF loss and excellent impedance control over very wide bandwidth
• High performance resonance free bypass for low impedance power supplies
• Allows on-wafer evaluation of high performance digital circuits
• Minimal distortion of high-speed digital signals
• Maximized eye diagram test performance at wafer test
• Durable Air Coplanar tip technology for long contact life