800-550-3279 ::  503-601-1000  ::  Log On  ::  日本語

Eye-Pass® Multicontact DC Probe

Products

Eye-Pass® Design Capture Form

Our online Probe Design Capture form allows you to submit a probe design and request for quote. View more

Contact Sales & Service

For immediate assistance, please contact us at 1-800-550-3279 (1-503-601-1000) or complete our online inquiry form

Sales Inquiry Form

Service Request Form

Related Files
Related Pages

Durable multi-contact wafer probe with controlled impedance power bypass technology

The multi-contact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head. Available contact types are ground, logic, standard and Eye-Pass power supply, power supply sense, and ac signal.

Features
  • High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
  • RF bandwidth to 500 MHz
  • Long probe life: > 250,000 contacts
  • Flexible configuration; can mix ground, logic, power supply, ac signal, or power supply sense
  • Up to 12 contacts per probe head
  • Beryllium-copper tips for gold pads or tungsten for aluminum pads
Advantages
  • Allows on-wafer evaluation of high-performance digital circuits
  • Oscillation-free testing of wide-bandwidth analog circuits
  • Use with ACP series probes to provide functional at-speed testing for known-good-die
  • Long life for production testing
  • Fully compatible with your existing Cascade Microtech probes and probe stations