The DCP100 delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes.

Features

• High-quality construction with low-noise electrical performance
• Kelvin version for convenient 4-point measurements
• Choice of tip radii
• SSMC 50 connectors
• Replaceable coaxial probe tips

Advantages

• Ultra-low, fA and fF measurements from -65 º C to 150 º C
• Full electrical guard to the probe tip
• Integrally designed as part of Cascade's complete measurement solution
• Highly reliable, stable and repeatable