DC Parametric Probes
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Related Files
Cascade Microtech's DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.
DCP100 Series Probe Holder
The DCP100 Series Probe Holder delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes. [View more]
DCP-HTR High-performance DC Parametric Probe
The DCP-HTR probe holder delivers fA-level measurement capability from -65°C to 300°C for advanced characterization and reliability testing. Its unique design offers superior guarding and shielding over-temperature, overcoming the high-temperature performance limitations of standard coaxial needles. [View more]
