Fast, accurate and reliable resistivity testing

Your key to accurate characterization of on-wafer resistance properties, the C4S Resistivity 4-point probe head provides precise, repeatable measurements for faster, less-costly testing.

• 50,000 accurate, repeatable measurements per probe head
• Probe tip pressure is field adjustable to compensate for wear
• Anodized-aluminum body electrically shields all active internal components
• Built-in main compression spring through a semi-rigid spacer ensures equalized tip pressure even on uneven wafer surfaces
• Unique composition nosepieces ensure smooth tip travel; outlast jeweled bearings
• Available with full range of probe spacing, tip material and radii, and spring pressure choices

Specifications

• Side deflection: 1.25 μm (0.05 mils) maximum 
• Vertical stroke: 2.54 mm (100 mils) maximum
• Spacing Accuracy: ±1%
• Displacement Accuracy: 0.1%

Part Number
C4S-XY/WZ (X= Spacing, Y= Pressure, W= Tip Radius, Z= Tip Material)