Probes
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Probe Repair
Protect your probe investment and lower your cost-of-ownership. Cascade Microtech's probe repair program makes it easy to get started. View more
Probes Support
Find service and support information for your Infinity™, ACP, Unity™, EyePass™ DCP100, DCP-HTR, HCP, HVP, Fixed Pitch, and other engineering probes View more
Cascade Microtech offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF, microwave and millimeter-wave probes in the Infinity Probe®, Air Coplanar Probe and |Z| Probe® families, as well as probes for DC parametric test and failure analysis.
RFIC & Wedge Probes for Functional Test
Durable, high-performance multi-contact (wedge) probes streamline RFIC engineering test. [View more]
|Z| Probe® Power
To provide highly accurate characterization of RF power devices at wafer level, the |Z| Probe® Power, based off proven |Z| Probe technology, handles high power at high frequencies (up to 40 GHz). The |Z| Probe Power provides excellent contact repeatability and extremely low contact resistance to deliver accurate results in load-pull measurement setups, which are typical for characterizing RF power devices. [View more]
DC Power Probes
Cascade Microtech's power device probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power seimconductors up to 60A and 3000V. [View more]
DC Parametric Probes
Cascade Microtech’s DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes. [View more]
Signal Integrity / MCM Probes
Cascade Microtech offers precision, durable fine pitch probes, ideal for signal integrity probing on IC packages and circuit boards. [View more]
Photonics
The LWP probe can illuminate and collect optical signals used in the characterization of a variety of photonic devices. When combined with Cascade Microtech’s probe stations, and RF and DC probes, the LWP probe can provide modulation, spectral, time domain and low-level DC/CV measurements. [View more]
Custom/Specialty Probes
Cascade Microtech designs and builds a wide variety of custom and specialty probes. If you are unable to find a probe that meets your needs on our website, please contact us and we will be happy to discuss specific requirements for your application. [View more]
Calibration Tools
Our families of calibration substrates supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. [View more]
WinCal XE Software
WinCalXE software is a comprehensive and intuitive on-wafer RF measurement calibration tool to achieve accurate and repeatable S-parameter measurement. The latest version, WinCalXE 4.5, covers Infinity Probes, ACP probes and |Z| Probes, and is compatible with both Nucleus and ProberBench prober control software. [View more]