The Next Generation in High-Throughput, Wafer-Level Production Test

The Cluster Probe System is a revolutionary new method for wafer-level functional test in a production environment.

The CP series integrates several prober modules with a centralized controller and a shared wafer-handling robot. The compact design of the system takes up significantly less space than a standard production probe system. It also allows the system to be accessed from all sides, making maintenance and operation quick and easy.

Modularity and flexibility are the key requirements in any production environment. The CP series can be easily configured to test any devices ranging from optoelectronics (LEDs, VCSELs, etc.) to RF and microwave and MEMS devices. Additionally, the number and type of modules per unit can be configured according to your testing needs.