PA300: Semiautomatic Probe System
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Highest Positioning Accuracy for 300 mm Testing
Features and Benefits
- Best probe station for testing up to 300 mm
- Ideal for failure analysis and device characterization and modeling (DC to 325 GHz)
- Submicron probing capability
- Intuitive, user-friendly control system
- Vast array of accessories for a complete, customized test solution
Rigorous research and development resulted in a high-precision probe system, which is manufactured using highly-skilled labor and quality components. Whether it be failure analysis or device characterization and modeling, the PA300 is perfect for testing devices from DC to 325 GHz.
The industry-leading ProberBench™ Operating Environment gives you the ability to fully operate the probe system with or without a PC. When operated with a PC, the intuitive, user-friendly interface of the software suite gives you powerful options to maximize the effectiveness of the probe system.
For a complete wafer-level test solution, the PA300 can be configured with a vast array of accessories to meet your testing requirements.
