300mm Probe Stations
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Probe Systems Planning
Cascade Microtech 300mm probing solutions set the standard for on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
Elite 300 Probe Station
The Elite 300 probe station sets the new standard for 300mm on-wafer test. Whether your application is RF/DC device characterization, Wafer-Level Reliability, or IC failure analysis and design debug, the Elite 300 probe station delivers the precision and versatility needed for complex on-wafer testing. [View more]
PA300: Semiautomatic Probe System
For a complete wafer-level test solution, the PA300 can be configured with a vast array of accessories to meet your testing requirements.
Wafer size: ≤ 300 mm
Main Applications: DCM, FA [View more]
PA300 ProbeShield 3D
The PA300PS 3D is the first probe station for electrical probing of 3D stacked structures on wafer level. Many different engineering and monitoring tests after wafer production as well as before the next stacking steps or final packaging can be addressed with this flexible tool. [View more]
PM300: Precise & Stable 300 mm Probing
The PM300 Analytical Probe System is the industry benchmark in manual semiconductor failure analysis and in-process testing. Its versatility meets a wide range of probing applications.
Wafer size: ≤ 300 mm
Main Applications: DCM, FA [View more]
