PA200 Semi-automatic Probe System
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200mm Semi-automatic Testing at Its Best
Features and Benefits
- Most precise 200 mm probe system
- Ideal for failure analysis and device characterization and modeling (DC to 325 GHz)
- Submicron probing capability
- Intuitive, user-friendly control system
- Vast array of accessories for a complete, customized test solution
The PA200 semi-automatic probe station relies on precision engineering to provide a stable environment for the most exacting applications. Due to the high stability and accuracy of the probe station, the PA200 is ideal for failure analysis and device characterization and modeling of devices from DC to 325 GHz. Additionally, your results are guaranteed to be accurate for engineering test of optoelectronic (LEDs) and MEMS devices using the PA200 prober.
The industry-leading ProberBench™ Operating Environment gives you the ability to fully operate the probe system with or without a PC. When operated with a PC, the intuitive, user-friendly interface of the software suite gives you powerful options to maximize the effectiveness of the probe system.
For a complete wafer-level test solution, the PA200 can be configured with a vast array of accessories to meet all your testing requirements.
