200mm Probe Stations
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Cascade Microtech’s industry standard 200 mm wafer probing systems are in use at virtually all leading semiconductor manufacturing and design sites worldwide. They have been designed to allow access the full measurement range of today’s most advanced test instrumentation. Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
PM8 Manual Probe System
The PM8 Analytical Prober is the benchmark in manual failure analysis and in-process testing. This modular system meets customers' needs for precision, reliability and cost of ownership.
Wafer size: ≤ 200 mm
Main Applications: DCM, FA [View more]
Summit
Summit series probe stations, with PureLine™ and AttoGuard® technology, allow you to access the full range of your test instruments for 200 mm and 150 mm wafers. Whatever your application: RF/Microwave, device characterization, wafer level reliability, e-test, modeling, or yield enhancement, Summit series platforms lead the industry in on-wafer measurements. Summit AP, M and S platforms are easy to configure with your choice of measurement performance, chuck size, thermal range and microscope options. All platforms are -60°C to 300°C compatible to ensure an upgrade path to meet your future needs. Cascade Microtech provides many accessories for the Summit platform for a wide range of applications to suit your unique test needs. [View more]
PA200 BlueRay™ Probe System
Setting a new standard for high-speed accuracy, the PA200 BlueRay™ probe station is precisely the solution you need for wafer-level functional test of discrete devices.
High-Throughput Production Test System
Wafer size: ≤ 200mm
Main Applications: Production Test [View more]
AP200 BlueRay™ Probe System
The AP200 BlueRay™ probe system is now the only probe system in the world that can be upgraded from a semiautomatic to a fully-automated wafer prober in the field in a few hours. To meet growing production demands, a unique, wafer-handling robot can be docked onto the PA200 BlueRay. Once the docking process is complete, the robot then handles all wafers automatically.
High-Throughput Production Test System
Wafer size: ≤ 200mm
Main Applications: Production Test [View more]
PA200 Semiautomatic Probe System
The PA200 semiautomatic probe station relies on precision engineering to provide a stable environment for the most exacting applications.
Wafer size: ≤ 200mm
Main Applications: DCM, FA [View more]
