200mm Probe Stations
Cascade Microtech’s industry standard 200 mm wafer probing systems are in use at virtually all leading semiconductor manufacturing and design sites worldwide. They have been designed to allow access the full measurement range of today’s most advanced test instrumentation. Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
Summit 11000/12000 Probe Stations
The Summit series measurement platforms, with PureLine™ and AttoGuard® technology, allow you to access the full range of your test instruments for 200mm and 150mm wafers. Whatever your application: RF/Microwave, device characterization, wafer level reliability, e-test, modeling, or yield enhancement, Summit series platforms lead the industry in on-wafer measurements.
R48/R61 Failure Analysis & General Purpose Systems
Flexible and affordable the REL-6100 and REL-4800 Series Parametric Probe Stations combine precision sub-micron probing capability needed for IC failure analysis and design de-bug. Sub-micron resolution, precise motion control, and 8-inch travel.
Sales Assistance and Quotes
For immediate assistance, please contact us at 1-800-550-3279 (1-503-601-1000) or complete our online sales inquiry and quote form for fast, friendly assistance from the Cascade Microtech experts.
Probe Station Facility Guide
This guide contains information for configuring your facility for a Cascade probe station.
