150mm Wafer Probing Stations

Cascade Microtech offers several cost-effective manual probing solutions for 150mm DC and RF. With a modular design, our platforms offer a broad range of configuration possibilities to deliver precision measurement and analysis.

 

M150 Measurement Platform

M150 Measurement Platform Cascade Microtech’s M150 Measurement Platform addresses a wide array of measurement challenges. The probe station has a modular design that offers a broad range of configuration possibilities for precision electrical measurements for a variety devices such as cingulated die to 150mm wafers, modules and printed circuit board assemblies.

EP6 RF Probing Package

EP6 RF Probing Package The EP6 RF probing package is designed to give you a cost-effective solution for highly-accurate S-parameter measurements. The package includes the renowned, long-life |Z| Probes®, SussCal® Professional calibration software and a CSR calibration substrate. This ensures high measurement accuracy and repeatability.

Wafer size: ≤ 150 mm
Main Applications: RF Test

EP6 DC Probing Package

EP6 DC Probing Package The EP6 DC probing package is designed to give you a cost-effective solution for highly-accurate DC measurements such as simple I-V and C-V measurements as well as on-wafer failure analysis.

Wafer size: ≤ 150 mm
Main Applications: DC Test

PM5: 150mm Manual Probe System

PM5: 150mm Manual Probe System The PM5 Analytical Probe System is intended for cost-effective and precise analysis of wafers and substrates up to 150mm. High application flexibility is guaranteed with the PM5, which is suitable for the whole spectrum of DC and HF measurements.

Wafer size: ≤ 150 mm
Main Applications: DCM, FA