Robust Wafer-Level RF Production Test

The |Z| Probe® Card is the most unique RF production probe card available. It is the only fully-repairable probe card that integrates |Z| Probe Technology into a versatile, production-floor ready probe card format. Since any |Z| Probe can be integrated into the |Z| Probe Card, the possibilities are endless. One to four probes can be arranged in a North-East-South-West configuration, or four probes can be arranged in an East-West or North-South configuration for dual-die test.

The |Z| Probe Card can be configured to test up to 32 RF/Microwave signals, and mixing RF/Micowave and DC signals is also possible. A long lifetime of over one million (1,000,000) touchdowns is guaranteed for each probe integrated into the |Z| Probe Card. Once a probe is no longer usable or has been damaged, it can simply be replaced with a new one – saving you a significant amount of repair and replacement costs when compared with traditional probe cards.

In conjunction with the BlueRay Probe System and SussCal® Professional, you have a complete, high-throughput RF/Microwave production test system from one supplier.