DC Parametric Probes

Cascade Microtech's DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.

 

DCP100 Series Probe Holder

DCP100 Series Probe Holder The DCP100 Series Probe Holder delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes.

DCP-HTR High-performance DC Probe Holder

DCP-HTR High-performance DC Probe Holder The DCP-HTR probe holder delivers fA-level measurement capability from -65°C to 300°C for state-of-the-art reliability testing. Its unique design offers superior guarding and shielding over-temperature, overcoming the high-temperature performance limitations of standard coaxial needles.