Engineering Probes

Cascade Microtech offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF microwave probes in the Infinity, Air Coplanar and |Z| Probe families, DCPs for DC test and PE5s for failure analysis. Our probes support a broad range of probing uses at frequencies up to 220 GHz.

Did You Know?
Beyond the standard probes detailed here on our web site, Cascade Microtech designs and builds a wide variety of custom and specialty probes. If you are unable to find a probe here that meets your needs, please contact us and we will be happy to discuss specific requirements for your application.

 

RF Microwave Probes

RF Microwave Probes Cascade Microtech created the first microwave probe in 1983 that enabled the first on-wafer 18 GHz measurements and accelerated the commercialization of gallium arsenide chips. Our line of RF probes is designed to meet the challenges of high-frequency probing and ensures low and stable contact resistance on aluminum pads.

RFIC & Functional Test Probes

RFIC & Functional Test Probes Cascade Microtech's durable, high-performance multi-contact probes streamline RFIC engineering test.

DC Parametric Probes

DC Parametric Probes Cascade Microtech’s DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.

Power Device Probes

Power Device Probes Cascade Microtech's power device probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power seimconductors up to 60A and 3000V.

Board Test & Signal Integrity Probes

Board Test & Signal Integrity Probes Cascade Microtech offers precision, durable fine pitch probes, ideal for signal integrity probing on IC packages and circuit boards.

Photonics

Photonics The LWP probe can illuminate and collect optical signals used in the characterization of a variety of photonic devices. When combined with Cascade Microtech’s probe stations, and RF and DC probes, the LWP probe can provide modulation, spectral, time domain and low-level DC/CV measurements.

Custom/Speciality Probes

Custom/Speciality Probes Cascade Microtech designs and builds a wide variety of custom and specialty probes. If you are unable to find a probe that meets your needs on our website, please contact us and we will be happy to discuss specific requirements for your application.

|Z| Probe® Family

|Z| Probe® Family The |Z| Probe® family of RF and microwave wafer probes revolutionized the way you test your HF devices. Contacting your device under test (DUT) has never been easier and uses less overtravel than other wafer probes, which means less crashes and a longer probe life. In fact, the |Z| Probe is guaranteed to last for over one million (1,000,000) contacts.