WinCal XE Software
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Related Files
- WinCal XE Specification Sheet
- Connecting WinCal XE 4.5 to a VNA with VISA options
- Making Accurate and Reliable 4-port On-Wafer Measurement
- A High Isolation Dual Signal Probe Technology
- Measurement accuracy at mm-frequenciesand beyond: on-wafer calibration vs. de-embedding techniques
- Solve complexity issues in 4-port RF designs
- Optimized Impedance Standard Substrate Designs for Dual and Differential Applications
- A Hybrid Probe-Tip Calibration for Multiport Vector Network Analyzers
- Validation of On-Wafer Vector Network Analyzer Systems
- VNA Calset Port Augmentation for Impedance Matching Probe Calibration
Related Pages
WinCalXE software is a comprehensive and intuitive on-wafer RF measurement calibration tool to achieve accurate and repeatable S-parameter measurement. The WinCalXE features include exclusive 1-, 2-, 3-, and 4-port calibration algorithms, immediate and live data measurement and viewing, LRRM, LRM+, SOLT-LRRM hybrid and NIST-style multi-line TRL calibrations, as well as an Error Set Management capability for data comparison and augmentation. The latest version, WinCalXE 4.5, covers Infinity Probes, ACP probes and |Z| Probes, and is compatible with both Nucleus and ProberBench prober control software.
Features:
- Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
- LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
- Automatic load inductance compensation function ensures the most repeatable calibrations
