Multi-port/Differential Probing
The use of differential device architecture is becoming increasingly common in a wide range of RF applications. Cascade Microtech’s turnkey solutions enable on-wafer characterization of multiport or balanced devices and circuits. They include Cascade Microtech’s probe stations, dual probes, differential ISS, and calibration software with advanced 4-port calibration algorythms.
| Problems | Solutions |
|---|---|
| Signal to signal crosstalk on dual probes | Infinity Dual probes with superior field confinement and low coupling |
| Corrected multi-channel phase | WinCal XE calibration software and differential ISS |
| Achieving a probing tolerant 4-port calibration | WinCal XE's exclusive advanced 4-port hybrid LRRM-SOLR calibrations |
Sales Assistance and Quotes
For immediate assistance, please contact us at 1-800-550-3279 (1-503-601-1000) or complete our online sales inquiry and quote form for fast, friendly assistance from the Cascade Microtech experts.
Related Files
Making Accurate and Reliable 4-port On-Wafer Measurement
Solve complexity issues in 4-port RF designs
A High Isolation Dual Signal Probe Technology
Optimized Impedance Standard Substrate Designs for Dual and Differential Applications
A Hybrid Probe-Tip Calibration for Multiport Vector Network Analyzers
