1/f Flicker Noise Analysis

CMOS technology for wireless applications is driving flicker noise and other noise parameter measurements. Noise is induced by external factors making it difficult to find and characterize the corner frequency. This prevents accurate characterization of the intrinsic noise of the device. Our flicker noise probe stations, probes and accessories are designed for low background noise, improved RFI immunity, low conducted and locally-generated emissions.

ProblemsSolutions
Ultra low voltage measurementsNoise free probes and accessories
Electrically quiet environmentUltra low noise system architecture
Immunity from RFIMicroChamber RF shield enclosure
Oscillation-free measurementsDC probes with RF chokes
Broad frequency coverageWide Bandwidth RF probes