Software Solutions
Cascade Microtech offers several unique software solutions that enhance the functionality of your wafer-level test systems. Select a product below to learn more.
WinCal XE Software
WinCal XE enhances RF measurement accuracy and productivity through guided system setup, automatic calibraiton and validation, and other advanced RF measurement related tools.
Nucleus: Probe Station Control Software
Cascade Microtech Nucleus software enhances your test investment by providing quick results in a flexible and integrated environment. Each wafer test step from loading and aligning, creating wafer maps, collecting test data, and analyzing results has been carefully crafted to optimize your time spent taking measurements.
LabVIEW Integration Toolkit
The LabVIEW Integration Toolkit enables test engineers to quickly and easily get their LabVIEW test programs "up and running" with Cascade Microtech Semi-automatic probe stations. The Toolkit includes a LabVIEW prober driver, 3 example programs (including source code - VI’s), manual and full on-line help.
SussCal® Professional: RF & Microwave Wafer-Level Calibration Software
SussCal® Professional is the most advanced, easy-to-use wafer-level calibration software available. It was designed by leading RF and microwave engineers to optimize your wafer-level measurements from DC to 110 GHz and beyond.
MicroAlign™ and ReAlign™ Technologies
As semiconductor devices get smaller, so do test structures and pad sizes (< 40 µm). Additionally, probing on bumped wafers is becoming more common. For these fine-pitch and bump array probing applications, a standard cantilever probe card is impractical. Instead, vertical probe cards must be used, which poses a significant challenge to the operator.
ProberBench™ Operating Environment
The ProberBench™ Operating Environment is a powerful tool that uses optimally matched hardware and software components to provide fast and accurate prober response. The





