Accessories & Upgrades

Precision measurement capability does not end with the probe and probe station. We offer a complete set of accessories to allow you to position, navigate, determine signal fidelity, and contact the wafer or device under test.

EDGE 1/f Noise Measurement Module

The EDGE flicker noise measurement module is a field-upgradable retrofit to most Cascade Microtech probe stations, and includes software tools for 1/f noise modeling and statistical analysis.

Software Solutions

Cascade Microtech offers several unique software solutions that enhance the functionality of your wafer-level test systems.

eVue-II Digital Imaging System

The eVue™-II digital imaging system is a revolutionary new microscopy tool optimized for on-wafer test with Cascade Microtech Probe Stations. It radically improves wafer navigation, test setup, and probe contact accuracy through the integration of microscopy, digital imaging, and software automation. By combining new wafer probe navigation tools with next generation digital microscope technology, users can now see, touch, and measure devices far beyond a traditional microscope.

Positioners

Cascade Microtech's probe positioners are optimized for various applications and compatible with all Cascade Microtech’s probes and probe stations. They ensure you micron placement accuracy, and superior planarity adjustments.

PureLine Technology

PureLine ensures confidence in your test data from process development through characterization and modeling to long term reliability and failure analysis test. Cascade Microtech probing systems with PureLine technology will keep you on the road and ahead of the curve.

Cables

Cascade Microtech's range of low-loss thermally stable cables, ensures higher quality measurements and longer lasting calibrations. Each cable has a male connector at one end that connects to the probe and a female connector at the other end to connect to the test instrumentation. For vertical style probes, the male connector includes an integrated 90º elbow.