01 Apr 09Cascade Microtech Wins “Best in Test” Award for EDGE™ Flicker Noise Measurement System

Award reinforces Cascade Microtech's 25-year commitment to award-winning technology leadership and innovation in test and measurement

BEAVERTON, OR, April 1, 2009- Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that its EDGE Flicker Noise Measurement System was voted by Test & Measurement World readers as "Best in Test" in the category of Semiconductor Equipment. The award will be distributed at a special ceremony on April 1st during the APEX Conference in Las Vegas, Nevada. The "Best in Test" awards are presented annually by Test & Measurement World to honor important and innovative new products and services in the electronics test and measurement industry.

Cascade Microtech introduced the award-winning EDGE Flicker Noise Measurement System in May of 2008, the only 1/f noise measurement system certified to provide accurate measurements from 1Hz to 30 MHz. Differentiated by its high bandwidth and unprecedented noise immunity, the superior functionality of the EDGE system is dedicated to creating a truly worry-free measurement environment. The flexible system allows switching between flicker noise and DC measurements on the same system without changing setup. It can also measure both flicker noise and DC parameters over temperature (-60°C to 300°C). Across the semiconductor industry, EDGE delivers new levels of certainty to companies that must continue to improve device performance, increase yield, command higher margins and reduce time to market.

"It is an honor to be recognized by our industry peers for our commitment to innovation excellence in test and measurement as we celebrate our 25th anniversary," said Geoff Wild, CEO, Cascade Microtech. "This award reinforces our strategic initiative to deliver leading-edge, practical solutions that solve our customers' toughest test and measurement problems."

About EDGE

With the cost of developing each new semiconductor manufacturing process node escalating dramatically and time-to-market pressures increasing, there is no room for error in measuring critical parameters such as flicker noise. The EDGE system provides accurate flicker noise measurements up to 30 MHz with low background noise, typically less than 1.2 nV/√Hz at 100 kHz and above. The wide frequency range and low background noise of the EDGE allow users to increase device performance, command higher margins, and reduce time to market using one fully integrated measurement system.
Conventional systems bolt together system elements from as many as five different vendors, including prober, software, IV meter, MCU, and DSA. In contrast, the EDGE seamlessly integrates a probe station, instruments, software, and accessories, eliminating the need for custom fixturing or instrumentation. In addition, the EDGE lets you switch between flicker and DC measurements with push-button automation, providing both sets of measurements, over temperature, in one system. This eliminates risky transfer of the wafer from one measurement station to another and removes the risk of error associated with reconfiguring bolted-together solutions to change their functionality