Press Release
Company
08 Jan 07Cascade Microtech’s Configurable M150 Measurement Platform Awarded "Best in Test" by Test & Measurement World
Beaverton, Ore.—January 8, 2007—When Cascade Microtech introduced the M150 Measurement Platform in April 2006, it broke new ground in affordability and configurability. Until the M150, the concept of “all measurements on only one platform” never existed. Test & Measurement World recently recognized this revolutionary product with a 2007 Best in Test award in the category of probing systems. Every year, T&M World honors the industry’s most important and innovative new products and services with their Best in Test awards.
The M150 Measurement Platform was the first to provide high-performance and precision electrical measurements, from DC to high-frequency RF, for any type of 150mm device on a single platform. The M150 helps customers solve device problems such as those related to power consumption, operating frequency, signal isolation, signal integrity and channel bandwidth.
With interchangeable standard parts and accessories optimized for specific measurement needs, the M150 Measurement Platform can be easily customized to switch between applications within minutes to measure any device–semiconductor wafers, ICs, printed circuit boards, MEMS and even bioscience devices. Its unmatched versatility can save customers tens of thousands of dollars on the purchase of separate measurement stations.
Every year since 1991, the editors of Test & Measurement World have presented their Best in Test Award to the most superior products from all areas of electronics testing and inspection.

