03 Oct 05Cascade Microtech announces new calibration and measurement software to increase efficiency of RF measurements

Unique software package enables accurate and repeatable metrology-grade measurements of complex, high-speed semiconductors

Beaverton, Ore.—October 3, 2005—Cascade Microtech (NASDAQ: CSCD) today announced WinCal 2006 software to address the testing challenges brought on by the increase in the volume of complex, high-speed semiconductors that are designed and tested for use in mobile communications products such as cell phones, PDAs and laptop computers. Compounding the high-speed problem is the fact that chips are becoming increasingly complex and with this complexity there is an increased potential for errors in measurement. With the proliferation of radio frequency-based devices comes the need to make accurate and repeatable RF measurements on-wafer to ensure they don’t fail in production.  Since the responsibility for testing often falls to the research and development team, many engineers must perform—for the first time—high-frequency device characterization using a wafer probing station coupled with a vector network analyzer (VNA). WinCal 2006 software offers:

• Fast start for new and experienced users
• High confidence in RF measurements
• Support for multiport calibration on differential devices

Fast start for new and experienced users

WinCal 2006 automates calibration of the VNA with ISS (impedance standard substrate) standards at the probe tip to remove repeatable errors from the VNA, cable and probe losses and reflections.  For engineers who are characterizing RF wafers for the first time (and have never used a vector network analyzer) or experienced engineers looking to reduce calibration time, WinCal 2006 has a number of features that save time before, during and after measurement. To enable a fast start for system users, WinCal 2006 provides:

• Guidance systems including wizards and video tutorials
• Auto selection of compatible standards based on system set-up
• Automatic tracking of physical elements of the system
• ISS management and visual map of ISS

High confidence for RF measurements

Prior to doing any RF device characterization, the measurement system must be calibrated to the reference plane or probe tip. The more accurate the calibration is, the lower the measurement uncertainties. More accurate data collected means fewer design iterations and costly failures in wafer production.  Unlike other software calibration techniques that are time-intensive to set-up and give no help or guidance, WinCal 2006 automates and guides the user through the numerous details associated with setting up the VNA calibration and verification.
WinCal 2006 software dramatically speeds system calibration, providing better calibrations and increased measurement confidence, even for less experienced users. It minimizes operator mistakes and reduces troubleshooting time through ease of use, monitoring, and the ability to identify and flag errors as they occur.

WinCal 2006 automates the calibration process so it does not need to be performed on the vector network analyzer’s front panel—a time consuming and error-prone task. Automated calibration techniques include SOLT (short, open, load, thru), LRM (line, reflect, match), and LRRM (line, reflect, reflect, match). The LRRM and LRM/LRRM load inductance corrections provide accuracy improvements over the basic LRM method, and are only available from Cascade Microtech. WinCal 2006 enables high confidence in your RF measurements with:

• Easily manipulated RF data acquisition and viewing
• Sophisticated built-in VNA calibration methods
• Monitoring tools to identify possible errors as they occur
• System qualification before, during and after the measurement

Support for multiport calibration on differential devices

One of the fastest growing challenges in RF measurements is the characterization of structures such as differential architectures that have greater than two ports. WinCal 2006 software offers a clearly defined solution and easy-to-use multiport test methodology for absolute confidence in the multiport calibration and measurement results.

With enhanced ISS mapping and test system validation, WinCal 2006 is built from the ground up for multiport calibration. This includes stepping through the calibration sites logically and ensuring that no sites are missed during the calibration process. WinCal 2006 assures repeatable results through its system validation and drift monitoring capability on all four ports of the device simultaneously. Support for differential measurements in WinCal 2006 includes:

• Enhanced ISS mapping of multiport calibration structures
• Intelligent support for complex probe combinations and orientations

WinCal 2006 ease of use features save valuable engineering time

Using WinCal 2006 solves a wide variety of common problems including data correlation, training of new users, obtaining correct calibration coefficient definitions, calibration verification, erroneous use of untrimmed or non-50 ohm loads, and determining the source of unexpected or suspect measurement data—just to name a few. Whether an engineer is experienced or new to RF device characterization, WinCal 2006 will provide a much easier path to success for RF wafer testing.