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Apr. 30, 2013 :: NEWS Cascade Microtech Reports First Quarter 2013 Results
Apr. 23, 2013 :: NEWS Cascade Microtech to Announce First Quarter Results on April 30, 2013
Mar. 28, 2013 :: NEWS Cascade Microtech Named Finalist of 2013 EE Times and EDN ACE Award for Ultimate Products – Test & Measurement Systems and Boards
International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Event Details
How InfinityQuad™ Probes Help DICE Characterize Mixed-Signal Devices with Small Pads
Danube Integrated Circuit Engineering (DICE), a radar IC manufacturer in Austria, makes mmW receiver/transmitter ICs for automotive collision avoidance radar applications. These devices have close to 100 connections surrounding a 5 mm2 die, with up to 25 mixed-signal contacts per side, limiting the size of the pads to 80 μm x 80 μm. Read our case study and learn how DICE overcame testing challenges and reduced test times by 50% using InfinityQuad probes. [Download]
Consistent Parameter Extraction for Advanced RF Devices
Pushing device operation frequencies towards the sub-THz range causes serious challenges for conventional device characterization techniques. This application note presents a comparison of SOLT, NIST multiline TRL, and LRRM probe-tip calibration methods for accuracy of measured and extracted figure of merits (FoM) of advanced BiCMOS HBT. A good understanding of possible sources of errors and potential room for improvement at each step are key to increasing the accuracy of device characterization. This paper will show why eLRRM is recommended as an accurate, consistent and easy to implement probe tip calibration method for characterization of advanced high-performance active devices.
N+1-Port SOLT/SOLR Calibration
The calibration solution presented in this document is focused on InfinityQuad™ probes, where the probes are assumed in all four quadrants of the device under test (DUT). It is shown that the proposed N+1-port SOLT/SOLR calibration can calibrate an N-port network of the InfinityQuad placed in four quadrants, using a standardized calibration procedure and standard calibration substrates that are commonly available. Although the inconsistency of the delay can cause measurement uncertainty, it is shown that their effects are likely to be minimal in most practical applications.
Flexible 300 mm Probing Platform
Cascade Microtech’s CM300 is a flexible on-wafer measurement platform that scales to meet evolving needs in capability and automation. It enhances device and process characterization and modeling by capturing the true electrical performance of devices and enabling hands-off productivity. With the new Velox™ probe station control software, the CM300 enables safe and fast wafer loading and easy test automation and measurement system integration, while preventing damage of probe tips, probe cards and customer wafers throughout the entire measurement cycle.
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Foundation Laid for PML5 Goal with ISO 9001:2008 Certification
Cascade Microtech’s Beaverton, Oregon operation received the ISO 9001:2008 award recognizing its Business Management System is installed and gaining maturity across all of its sites; it is robust and sufficient to meet the Company’s intended growth objectives. The system – which includes processes spanning engineering, marketing, Customer operations, manufacturing operations, finance and human resources – has been designed to scale for those objectives. Processes audited and certified include the product life cycle process, order generation, order fulfillment, post-delivery support, product non-conformance, supply chain management, and supporting processes. Read more ...
First Fully-automatic High-power Device Measurement Probe System
In recent years, high-energy standards set by government agencies around the world have rapidly
increased the demand for power devices. This increasing demand
for high-power devices and the need for lower cost systems put
tremendous pressure on device manufacturers to keep up with
production. One of the major issues that power device manufacturers
are facing is the need to increase throughput of power device tests.
The APS200TESLA, a fully-automatic on-wafer probe station, is
the industry’s first dedicated test system for high-power device
manufacturing. The APS200TESLA ensures accurate production test up to 10.5 kV/400 A,
while providing a regulatory-certified safe testing environment.
The APS200TESLA significantly improves productivity and throughput during production test of high-power devices, increasing margins and reducing time-to-market.
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150 mm Manual Application-specific Probe Solutions Available
Achieve accurate measurement results in the shortest time – with maximum confidence. Based on the MPS150 manual probe station,
Cascade Microtech offers pre-configured probing packages, dedicated for specific applications such as I-V/C-V measurements, failure analysis,
RF, mmW and sub-THz, as well as power device characterization.
Designed for convenience and ease of operation, these systems are ready to start saving you time and money... right out of the box.
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