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Jun 15 2009 Cascade Microtech Expands Capabilities of On-Wafer Power Device Characterization

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced a set of new probes and accessories for its Tesla on-wafer power device characterization system, making it fully compatible with the recently released Agilent B1505A power device analyzer. The combined solution offers an extended triaxial measurement range to accommodate low noise probing of power devices up to 2000 volts. View more

Jun 8 2009 Cascade Microtech Announces First Complete Engineering and Production Probing Solutions Enabling High-Volume 60-80 GHz RFIC Manufacturing

Complete probing solution for mmW RFIC test meets the complex requirements of automotive radar and wireless HDTV device test View more

For a complete list of events click here.

European Microwave Week

September 28, 2009 - October 2, 2009
Nuova Fiera di Roma, Rome, Italy


[ Website ]

25th Anniversary Promotion 25% off Probe Station Accessories

In honor of its 25th Anniversary, Cascade Microtech is pleased to reward its active Service Contract holders with discounted pricing for probe station accessories. Take advantage of 25% savings on a variety of accessory products.

   WinCal XE Free WinCal XE Demo Available!

Request a 30-day trial of WinCal XE by completing our online request form or calling our Sales Department at 1-800-550-3279 (1-503-601-1000) and requesting part number: 142-173.
Unity Probe Unity Probe

The Unity probe is well-suited for on-wafer circuit measurements for engineering design debug and verification. This build-to-order multicontact probe streamlines RFIC engineering test, saving you time, aggravation and money.

EDGE - Flicker Noise Measurement System EDGE: Fully Integrated Flicker Noise Measurement System

The EDGE™ Flicker Noise Measurement System is the world's only integrated, noise-immune measurement system that certifies accurate flicker noise measurements from 1 Hz to 30 MHz. For the first time ever, R&D engineers, technicians and lab managers who need to measure flicker noise for device modeling or process development can enjoy extraordinarily simple access to flicker noise data over the widest frequency range, with the lowest background noise.

Engineering Probe Selection Guide - Cascade Microtech offers a wide selection of engineering probes to meet the highly demanding and broad range of on-wafer and signal integrity applications. Our families of RF, mixed-signal and DC probes are designed to meet the many challenges of the var ...

Online Cleaning Methods for Pyramid Probe Cards - Pyramid Probe cards may collect contaminants that make cleaning necessary. The cleaning frequency and intensity required to keep a Pyramid Probe operating at its peak efficiency are primarily related to the probing environment. As a result, the exact form ...

Elite 300 Product Brochure - Taking the next step in 300mm probing means delivering a probe station that specifically solves the enormous measurement challenges brought on at each advancing technology node. Shrinking geometries, new process materials and increasingly complex designs ...