Mar 9 2010 Cascade Microtech Expands 1/f Noise Measurement Solution to Address Frequency Range of 1 Hz to 40 MHz

New features available as a retrofit module to existing Cascade Microtech probe stations or with new probe station to support both flicker noise and standard DC parametric tests View more

Feb 9 2010 Cascade Microtech Reports Fourth Quarter and 2009 Year End Results

Fourth Quarter Revenue of $15.5 Million, up 11% Sequentially; Tax Benefit Improves Fourth Quarter EPS Loss to 4 Cents View more

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Free WinCal XE Demo Available!
Request a 30-day trial of WinCal XE by completing our online request form or calling our Sales Department at 1-800-550-3279 (1-503-601-1000) and requesting part number: 142-173.

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The Unity probe is well-suited for on-wafer circuit measurements for engineering design debug and verification. This build-to-order multicontact probe streamlines RFIC engineering test, saving you time, aggravation and money.

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The Tesla on-wafer power device characterization system is now fully compatible with the recently released Agilent B1505A power device analyzer. The combined solution offers the industry's highest voltage and current range for on-wafer measurements up to 1500V triax / 3000V coax, and 60A pulsed / 10A DC, to accommodate low noise probing of power devices. The Tesla system meets the requirements of more advanced device characterization applications in automotive, mobile devices, transportation and power manufacturing.

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The EDGE™ Flicker Noise Measurement System is the world's only integrated, noise-immune measurement system that certifies accurate flicker noise measurements from 1 Hz to 30 MHz. For the first time ever, R&D engineers, technicians and lab managers who need to measure flicker noise for device modeling or process development can enjoy extraordinarily simple access to flicker noise data over the widest frequency range, with the lowest background noise.

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Engineering Probe Selection Guide - Cascade Microtech offers a wide selection of engineering probes to meet the highly demanding and broad range of on-wafer and signal integrity applications. Our families of RF, mixed-signal and DC probes are designed to meet the many challenges of the var ...

Probe Station Accessory Catalog - Cascade Microtech's Probe Station Accessory Catalog is a 'full text searchable' reference catalog which provides descriptive detail, graphics and order information. ...

Online Cleaning Methods for Pyramid Probe Cards - Pyramid Probe cards may collect contaminants that make cleaning necessary. The cleaning frequency and intensity required to keep a Pyramid Probe operating at its peak efficiency are primarily related to the probing environment. As a result, the exact form ...