RFIC & Functional Test Probes

Cascade Microtech's durable, high-performance multi-contact probes streamline RFIC engineering test.

 

Unity Probe ™ Multicontact probe for RFIC engineering test

Unity Probe ™ Multicontact probe for RFIC engineering test The Unity probe is well-suited for on-wafer circuit measurements for engineering design debug and verification. This build-to-order multicontact probe streamlines RFIC engineering test, saving you time, aggravation and money. An online design capture and request for quote form is available.

Eye-Pass Multicontact DC Probe

Eye-Pass Multicontact DC Probe The multicontact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head.

Multicontact DC Power Probe Series

Multicontact DC Power Probe Series The multicontact DC Quadrant Probe (DCQ) provides user-configured flexibility in a single probe head. The DCQ offers superior mechanical stability and enables the placement of high quality bypass capacitors within close proximity to the probe tip, minimizing series inductance. The WPH probe is ideal for applications not requiring a controlled impedance environment.

RF Quadrant Probes

RF Quadrant Probes Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade needles for low noise and high performance.