QFP / SO Test & Burn In Connector
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The Gryphics Product Group has developed its family of QFP40 test sockets as the superior alternative to higher-priced, long lead-time RF test sockets. For a fraction of the cost associated with ATE sockets, these low-cost, high-performance, compression-mount test sockets deliver superior signal integrity for peripherally leaded devices with integrated paddle-grounding systems.
| QFP/SO Test & Burn In Connectors | |
|---|---|
| Features | QFP40 |
| ![]() QFP Datasheet |
| Related Files |
|---|
| Gryphics - QFP 40 - Datasheet |







