Cascade Microtech Wins Two Awards for Tesla On-Wafer Power Semiconductor Device Characterization System
Tesla system recognized by industry-leading publications Electronic Products and Test & Measurement World
BEAVERTON, Ore.- January 14, 2008-Cascade Microtech today announced it has received the prestigious Product of the Year award from key industry publication Electronic Products for its Tesla power semiconductor device characterization system. Also in December, the Tesla system received an honorable mention from Test & Measurement World's Best in Test awards.
The Tesla system is the industry's only power device measurement system to provide a complete on-wafer solution for over-temperature, low contact resistance measurements of power semiconductors up to 60A and 3000V.
"The Tesla power device measurement system has reduced costs by eliminating the hassles of packaging devices before we characterize them," said Edouard de Fresart, power device section manager, SMARTMOS Technology Center, Freescale Semiconductor. "We still need to do the measurements at the package level since this is the real product. However we can do it on a mostly debugged and tuned-up product, so wafer level characterization saves a great deal of development time."
Tesla was introduced in May of 2007. It was judged by the editors of Electronic Products and Test & Measurement World, against nominated products released in the past year for its overall importance to the electronics industry at large. The Tesla system is featured in the January 2008 issue of both publications.
"We are obsessed with solving our customers' toughest probing challenges and Tesla is no exception," said Geoff Wild, CEO of Cascade Microtech. "This product is a perfect example of the value that Cascade Microtech brings to our customers. Quite simply we enable measurements to be done at the wafer-level, saving them loads of development time and in the end, making them more competitive."
About the Tesla Power Semiconductor Device Characterization System
The Tesla measurement system offers an on-wafer probing solution for measurements of power semiconductors up to 60 A and 3000 V over a temperature range of -55°C to +200°C. Exclusive chuck technology provides handling for wafers as thin as 100 µm and enables on-wafer measurements for devices up to 75 W. Tesla's high-current parametric probe minimizes thermal runaway at the probe-to-wafer contact, while handling up to 10 A of current in continuous mode and up to 60 A of current in pulsed mode. A high-voltage parametric probe measures breakdown currents as low as <1 pA at 1100V.
About Electronic Products
Electronic Products is designed as a forum for news of state-of-the-art electronic product developments. With a print circulation of 122,998, content is geared to electronic engineers and industry management personnel by providing data to apply in the various stages of the design cycle. Electronic Products is available on the Web at http://www.electronicproducts.com.
About Test & Measurement World
Established in 1981, Test & Measurement World is written for test engineering professionals in the worldwide electronics industry, who are responsible for the quality of electronics products and systems, whether they are involved at the design development, manufacturing, or field-service stages, as well as for buyers of these products. Highlights include feature-length application articles that help readers solve problems, as well as new and developing test, measurement and inspection techniques and technologies and updates on older techniques. Test & Measurement World has a print circulation of 65,000 and is available on the Web at http://www.tmworld.com/.
