Press Releases
July 17, 08 Cascade Microtech Announces Preliminary Second Quarter 2008 Results
Cascade Microtech, Inc. (Nasdaq:CSCD-News) today announced its preliminary results for the second quarter ended June 30, 2008. Moreabout:Cascade Microtech Announces Preliminary Second Quarter 2008 Results
May 22, 08 Cascade Microtech Expands Global Service and Support Footprint
Cascade Microtech announced global expansion with new offices and personnel in Munich as well as Phoenix, Arizona to provide service and support for production products customers in those regions. Moreabout:Cascade Microtech Expands Global Service and Support Footprint
May 19, 08 Cascade Microtech Offers Industry's First Fully Integrated Flicker Noise Measurement
With the cost of developing each new semiconductor manufacturing process node escalating dramatically and time to market pressures increasing, there is no longer room for error in measuring critical parameters such as flicker noise. Recognizing these market realities and their impact on semiconductor manufacturers, Cascade Microtech today introduced the EDGE Flicker Noise Measurement System, the only flicker noise measurement system that is certified to provide accurate measurements from 1Hz to 30 MHz. Moreabout:Cascade Microtech Offers Industry's First Fully Integrated Flicker Noise Measurement
May 19, 08 Cascade Microtech Announces Strategic Initiative to Maximize Lab and Fab Investments Via Fully Integrated Measurement Systems
In response to the ever-increasing cost associated with developing new process nodes, today Cascade Microtech announced a new initiative to develop integrated measurement systems for on-wafer semiconductor device characterization and process development. This innovative approach results in increased performance and accuracy as well as better, faster service and support and renders obsolete the traditional practice of bolting together system elements from multiple vendors. Moreabout:Cascade Microtech Announces Strategic Initiative to Maximize Lab and Fab Investments Via Fully Integrated Measurement Systems
April 29, 08 Cascade Microtech Reports First Quarter 2008 Results
Revenues of $20.8 million with higher Consumable
Revenues from Pyramid Probe Cards and Engineering Probes; Overall EPS is break-even with solid Cash Flow generation Moreabout:Cascade Microtech Reports First Quarter 2008 Results
April 2, 08 Cascade Microtech’s New P30 Pyramid Probe® Production Probe Card Lowers Cost of High-Volume Wafer Testing of RF Switches and Filters
To address the critical need to reduce the cost of high-volume testing of RF devices for the mobile handset market, Cascade Microtech today introduced a new Pyramid Probe card that brings high performance RF production test capability with over 50% cost-of-ownership savings over current approaches. Moreabout:Cascade Microtech’s New P30 Pyramid Probe® Production Probe Card Lowers Cost of High-Volume Wafer Testing of RF Switches and Filters
February 12, 08 Cascade Microtech Reports Fourth Quarter and 2007 Year End Results
Record Annual Revenue of $89.9 million, Up 6 % over 2006 and Diluted EPS of $0.07
Fourth Quarter Revenue of $22.0 million, Up 3% from Q3 of 2007 and Loss per share of $0.01 Moreabout:Cascade Microtech Reports Fourth Quarter and 2007 Year End Results
January 29, 08 Cascade Microtech Introduces World’s First 45 nm Capable DC/RF Parametric Probe Card Solutions, Lowers Cost-of-Ownership
Cascade Microtech today introduced two new Pyramid® parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors with advanced processes nodes at 65 nm, 45 nm and beyond, These leading-edge probe cards leverage Cascade Microtech’s new Pyramid Plus™ parametric probe card manufacturing technology which provides greater mechanical performance, lower leakage, low contact resistance and lowest inductance to rapidly deliver the most accurate and reliable measurements of ever-smaller process monitoring test structures. Moreabout:Cascade Microtech Introduces World’s First 45 nm Capable DC/RF Parametric Probe Card Solutions, Lowers Cost-of-Ownership
January 14, 08 Cascade Microtech Wins Two Awards for Tesla On-Wafer Power Semiconductor Device Characterization System
Cascade Microtech today announced it has received the prestigious Product of the Year award from key industry publication Electronic Products for its Tesla power semiconductor device characterization system. Also in December, the Tesla system received an honorable mention from Test & Measurement World’s Best in Test awards. Moreabout:Cascade Microtech Wins Two Awards for Tesla On-Wafer Power Semiconductor Device Characterization System
January 7, 08 Cascade Microtech Sets New Standard for 300mm Wafer Probing
Cascade Microtech introduced new 300mm wafer probe stations designed to meet the worldwide need for advanced on-wafer measurements for semiconductor devices. The Elite 300 sets a new standard for extremely accurate and reliable 300mm wafer probing for devices with process nodes at 45nm and below. Moreabout:Cascade Microtech Sets New Standard for 300mm Wafer Probing
