PDC50
World's first 45 nm capable DC parametric probe card
The PDC50 DC Parametric Pyramid Probe Cards enable the accurate monitoring of 65nm and 45nm parametric test structures, delivering superior signal integrity and faster settling time. Learn More
GRYPHICS TEST SOCKETS
Medium to high-volume, high-density, small-pitch, Gigahertz interconnection systems
Latest News
May 22, 2008 Cascade Microtech Expands Global Service and Support Footprint
May 19, 2008 Cascade Microtech Offers Industry's First Fully Integrated Flicker Noise Measurement
Product Spotlight
Unity Probe
The Unity probe is well-suited for on-wafer circuit measurements for engineering design debug and verification. This build-to-order multicontact probe streamlines RFIC engineering test, saving you time, aggravation and money.
About Cascade Microtech
Cascade Microtech is a worldwide leader in the precise electrical measurement of ICs and other small structures.
