Special Purpose Probes
Cascade Microtech’s special purpose probes enable high-performance electrical measurement for a variety of applications including high-current, high-voltage, optical and cryogenic probing.
High Voltage Parametric (HVP) Probe
Cascade Microtech’s High Voltage Parametric Probe provides the capability to make coaxial measurements up to 3000V and triaxial measurements up to 1100V while preserving a low-noise measurement path. The HVP probe is engineered with proprietary insulation materials that prevent against dielectric breakdown to enable low leakage measurements as low as 100fA at high voltage (1100V).
High Current Parametric (HCP) Probe
Designed specifically for testing power devices on wafer, the High Current Parametric Probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
Cryogenic ACP Probe
Designed to provide superior mechanical properties at cryogenic temperatures while maintaining solid RF measurement performance. Functional temperature range of -263 to + 150 ° C. Consistent tip geometry even at cryogenic temperatures.
View: Cryogenic ACP Probe
RF Quadrant Probes
Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade needles for low noise and high performance.
View: RF Quadrant Probes
40/80 Gb/s High Performance RF Quadrant
Designed to provide wide bandwidth RF connections and simultaneous resonant free power bypass connections for the special needs of high-speed mixed mode IC s for optical networks.
RF Quadrant Probes
Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade needles for low noise and high performance.
View: RF Quadrant Probes
| Related Web Pages |
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| RF Parameter Extraction for Semiconductor Device Modeling |
| Related Files |
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| 40/80 Gb/s High Performance Quadrant Probe technical and ordering information |
| Special Purpose Probe, Cryogenic ACP Probe |
| RF Probe Selection Guide |
