Probes
Cascade Microtech offers more than 50 different analytical probe models for wafer, package, and board level characterization. We offer RF microwave probes in the Infinity and Air Coplanar Series, DCPs for DC test and PE5s for failure analysis. Our probes support a broad range of probing uses at frequencies up to 220 GHz.
RF Probes
Cascade Microtech created the first microwave probe in 1983 that enabled the first on-wafer 18 GHz measurements and accelerated the commercialization of gallium arsenide chips. Our line of RF probes is designed to meet the challenges of high-frequency probing and ensures low and stable contact resistance on aluminum pads.
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DC Probes
Cascade Microtech’s DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.
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Special Purpose Probes
Cascade Microtech’s special purpose probes enable high-performance electrical measurement for a variety of applications including high-current, high-voltage, optical and cryogenic probing.
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