Probe Stations
Full portfolio of high performance probing solutions
Whether you need a cost-effective manual station for probing 150mm wafers or a semiautomatic thermal station to probe 200mm or 300mm wafers, Cascade Microtech offers a complete line of high performance solutions for on-wafer probing, circuit boards and modules, MEMS, biological structures, and electro-optic devices. Probe stations are available with accessories such as thermal control systems, special cables, calibration software, and industry leading probes that help you position, calibrate, and characterize your device under test. Cascade pioneered the first 1 femtoamp measurement, and offers systems that probe up to 220 GHz with extremely low leakage and low contact resistance.
Elite 300 Station Platform
The Elite 300 probe station sets the new standard for 300mm on-wafer test. Whether your application is RF/DC device characterization, Wafer-Level Reliability, or IC failure analysis and design debug, the Elite 300 probe station delivers the precision and versatility needed for complex on-wafer testing.
200mm Probe Stations
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
View: 200mm Probe Stations
M150 Measurement Platform
Cascade Microtech’s M150 Measurement Platform addresses a wide array of measurement challenges. The probe station has a modular design that offers a broad range of configuration possibilities for precision electrical measurements for a variety devices such as cingulated die to 150mm wafers, modules, printed circuit board assemblies, and microfluidic chips.
