Accessories & Upgrades
Precision measurement capability does not end with the probe and probe station. We offer a complete set of accessories to allow you to position, navigate, determine signal fidelity, calibrate, and contact the wafer or device under test.
eVue Digital Imaging System
The eVue™ digital imaging system is a revolutionary new microscopy tool optimized for on-wafer test with Cascade Microtech Probe Stations. It radically improves wafer navigation, test setup, and probe contact accuracy through the integration of microscopy, digital imaging, and software automation. By combining new wafer probe navigation tools with next generation digital microscope technology, users can now see, touch, and measure devices far beyond a traditional microscope.
Impedance Standard Substrates
Cascade Microtech's family of Impedance Standard Substrates (ISS) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Only Cascade Microtech offers the proven accuracy of LRRM calibrations with automatic load inductance compensation.
Cables
Cascade Microtech's range of low-loss thermally stable cables, ensures higher quality measurements and longer lasting calibrations. Each cable has a male connector at one end that connects to the probe and a female connector at the other end to connect to the test instrumentation. For vertical style probes, the male connector includes an integrated 90º elbow.
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PureLine Technology
PureLine ensures confidence in your test data from process development through characterization and modeling to long term reliability and failure analysis test. Cascade Microtech probing systems with PureLine technology will keep you on the road and ahead of the curve.
View: PureLine Technology
