RF Parameter Extraction for Semiconductor Device Modeling
Cascade Microtech’s RF/Microwave test systems include high performance probe stations, high frequency probes up to 220GHz, Impedance Standard Substrates, and calibration software with RF measurement support tools.
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| Support for multiple device pads sizes and pitches | Broad assortment of RF probes |
| On-wafer tolerant Network analyzer calibrations | Calibration software with advanced calibration algorithms |
| Defining precision reference structures for calibration | Variety of Impedance Standard Substrates |
| Noise free data | MicroChamber DUT shielding |
| Reliable and precise 4-port setup and calibrations | Advanced 4-port hybrid calibrations, standards, dual probes |
| Ft measurement to 220 GHz | Assortment of Waveguide probes for up to 220 GHz |
