Flicker Noise Analysis (1/f)
CMOS technology for wireless applications is driving flicker noise and other noise parameter measurements. Noise is induced by external factors making it difficult to find and characterize the corner frequency. This prevents accurate characterization of the intrinsic noise of the device. Our flicker noise probe stations, probes and accessories are designed for low background noise, improved RFI immunity, low conducted and locally-generated emissions.
| Ultra low voltage measurements | Noise free probes and accessories |
| Electrically quiet environment | Ultra low noise system architecture |
| Immunity from RFI | MicroChamber RF shield enclosure |
| Oscillation-free measurements | DC probes with RF chokes |
| Broad frequency coverage | Wide Bandwidth RF probes |
