IC or Memory Design Debug
Submicron motion control and laser systems
Cascade Microtech's probe stations offer submicron resolution and precise motion control needed for IC/memory design debug and on-wafer DC/CV parametric measurements.
| Requirements | Solutions | Advantages |
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| High magnification viewing of very small features | Mechanically stable probe systems | Repeatable and accurate probe placement |
| Microprobing of fine lines and features or FIB pads | Atomic Force Microscope support | Flexibility for a broad range of measurements |
| IC power-up internal node probing | Device probe card support. | Measurement confidence from proven systems |
| Localized de-processing | Multiple wavelength laser cutters | High- integrity device timing data |
| Timing analysis | High impedance probes | Precision high impedance tiiming measurements |
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