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Achieving consistent parameter extraction for advanced RF devices

This application note presents a comparison of SOLT, NIST multiline TRL, and LRRM probe-tip calibration methods for accuracy of measured and extracted figure of merits (FoM) of advanced BiCMOS HBT.

Achieving consistent parameter extraction for advanced RF devices

Created: August 23, 2017 | Updated: February 7, 2022 | Type: pdf | Size: 995.28 KB

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