Press Releases
Apr 24 2007 Cascade Microtech Reports First Quarter 2007 Results
Cascade Microtech (NASDAQ:CSCD), today reported financial results for the first quarter ended March 31, 2007. Revenues of $22.5 million, up 14% over Q1 last year and EPS of 9 cents, up 50% over Q1 last year View more
Apr 11 2007 Cascade Microtech to Announce First Quarter Results on April 24, 2007
Cascade Microtech, Inc. (NASDAQ:CSCD - News) will release financial results for its first quarter ended March 31, 2007 at approximately 4 p.m. EST, on Tuesday, April 24, 2007. The company will host a conference call beginning at 5 p.m. EST (2 p.m. PST) that same afternoon to discuss these results. View more
Apr 4 2007 Cascade Microtech Announces Acquisition of Gryphics, Inc.
Cascade Microtech (NASDAQ:CSCD), today announced it has acquired Gryphics, Inc., a private company that designs, manufactures and markets a range of high performance socket products used for final production and evaluation testing of packaged semiconductor integrated circuits. This acquisition is another strategic step in Cascade Microtech's long term vision of being a leading provider of advanced production test consumables for high performance ICs. View more
Feb 13 2007 Cascade Microtech Reports Fourth Quarter and 2006 Year End Results
“We are pleased to report record revenue for 2006,” said Eric Strid, CEO of Cascade Microtech. “We have seen strong growth in both divisions over last year. We have also continued to invest in the business in 2006 and expect to continue to do so in 2007 to position the Company for future growth in both revenue and earnings.” View more
Feb 6 2007 Cascade Microtech Reports Third Quarter 2006 Results
Jan 29 2007 Faster and More Accurate Wafer-level RF Measurement Enabled by New WinCal XE Software From Cascade Microtech
Unique in the wafer test market, only WinCal XE combines advanced calibration with RF accuracy enhancement features. Through powerful new measurement support tools and guidance systems that minimize operator mistakes, WinCal XE enables accurate and reliable RF measurements, a real problem with today’s complex semiconductor designs. View more
Jan 19 2007 Cascade Microtech to Announce Fourth Quarter and 2006 Year End Results on February 13, 2007
Cascade Microtech, Inc. (NASDAQ:CSCD) will release financial results for its fourth quarter and year ended December 31, 2006 at approximately 4 p.m. EST, on Tuesday, February 13, 2007. The company will host a conference call beginning at 5 p.m. EST (2 p.m. PST) that same afternoon to discuss these results. View more
Jan 8 2007 Cascade Microtech announces new position of VP Corporate Development and change in General Manager at Production Probes Division
Willis Damkroger, currently our Director of Worldwide Sales and Service for our Engineering Products Division (“EPD”), has been promoted to the position of VP and General Manager, Production Probes Division, reporting to the CEO. Willis began his career in semiconductors within wafer fabrication operations, grew through the ranks to manage multiple fabs, and then took sales and general management roles in small and medium-size semiconductor-related businesses. Willis joined Cascade Microtech in January 2006 and has demonstrated strong skills in managing operations and sales and marketing. View more
Jan 8 2007 Cascade Microtech’s Configurable M150 Measurement Platform Awarded "Best in Test" by Test & Measurement World
When Cascade Microtech introduced the M150 Measurement Platform in April 2006, it broke new ground in affordability and configurability. Until the M150, the concept of “all measurements on only one platform” never existed. Test & Measurement World recently recognized this revolutionary product with a 2007 Best in Test award in the category of probing systems. Every year, T&M World honors the industry’s most important and innovative new products and services with their Best in Test awards. View more
Nov 30 2006 Cascade Microtech Adds High-Current Model to Infinity Probe® Family
Beaverton, Ore.—November 30, 2006—Cascade Microtech is expanding its popular line of Infinity probes by adding a high-current model (rated two amperes) optimized for tuner-based characterization, power load-pull and noise parameter testing. The new high-current Infinity probe ensures accurate and repeatable wafer-level RF measurements at a higher current for characterization of linear power amplifiers and other RF power devices. View more
