Press Releases
May 19 2008 Cascade Microtech Announces Strategic Initiative to Maximize Lab and Fab Investments Via Fully Integrated Measurement Systems
In response to the ever-increasing cost associated with developing new process nodes, today Cascade Microtech announced a new initiative to develop integrated measurement systems for on-wafer semiconductor device characterization and process development. This innovative approach results in increased performance and accuracy as well as better, faster service and support and renders obsolete the traditional practice of bolting together system elements from multiple vendors. View more
Apr 29 2008 Cascade Microtech Reports First Quarter 2008 Results
Revenues of $20.8 million with higher Consumable
Revenues from Pyramid Probe Cards and Engineering Probes; Overall EPS is break-even with solid Cash Flow generation View more
Apr 2 2008 Cascade Microtech’s New P30 Pyramid Probe® Production Probe Card Lowers Cost of High-Volume Wafer Testing of RF Switches and Filters
To address the critical need to reduce the cost of high-volume testing of RF devices for the mobile handset market, Cascade Microtech today introduced a new Pyramid Probe card that brings high performance RF production test capability with over 50% cost-of-ownership savings over current approaches. View more
Feb 12 2008 Cascade Microtech Reports Fourth Quarter and 2007 Year End Results
Record Annual Revenue of $89.9 million, Up 6 % over 2006 and Diluted EPS of $0.07
Fourth Quarter Revenue of $22.0 million, Up 3% from Q3 of 2007 and Loss per share of $0.01 View more
Jan 29 2008 Cascade Microtech Introduces World’s First 45 nm Capable DC/RF Parametric Probe Card Solutions, Lowers Cost-of-Ownership
Cascade Microtech today introduced two new Pyramid® parametric probe cards that allow single-pass high-performance DC and RF measurements and reduce the cost of parametric production test for semiconductors with advanced processes nodes at 65 nm, 45 nm and beyond, These leading-edge probe cards leverage Cascade Microtech’s new Pyramid Plus™ parametric probe card manufacturing technology which provides greater mechanical performance, lower leakage, low contact resistance and lowest inductance to rapidly deliver the most accurate and reliable measurements of ever-smaller process monitoring test structures. View more
Jan 14 2008 Cascade Microtech Wins Two Awards for Tesla On-Wafer Power Semiconductor Device Characterization System
Cascade Microtech today announced it has received the prestigious Product of the Year award from key industry publication Electronic Products for its Tesla power semiconductor device characterization system. Also in December, the Tesla system received an honorable mention from Test & Measurement World’s Best in Test awards. View more
Jan 7 2008 Cascade Microtech Sets New Standard for 300mm Wafer Probing
Cascade Microtech introduced new 300mm wafer probe stations designed to meet the worldwide need for advanced on-wafer measurements for semiconductor devices. The Elite 300 sets a new standard for extremely accurate and reliable 300mm wafer probing for devices with process nodes at 45nm and below. View more
Dec 17 2007 Cascade Microtech Wins Global Technology Award for Grypper BGA Test Socket
Cascade Microtech announced that it has won a Global Technology Award, sponsored by Global SMT & Packaging magazine, for its Grypper ball grid array (BGA) test socket. View more
Dec 6 2007 Cascade Microtech Announces New CEO
Cascade Microtech (NASDAQ:CSCD - News), announced today that Geoff Wild has been named president and chief executive officer of the company by the Board of Directors. Mr. Wild, 51, has most recently been president and chief executive officer of Nikon Precision Inc., a wholly owned subsidiary of Nikon Corporation, where he has worked since 2002. View more
Oct 23 2007 Cascade Microtech Reports Third Quarter 2007 Results
Cascade Microtech (NASDAQ:CSCD - News), today reported financial results for the third quarter ended September 30, 2007. View more
