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Oct. 7, 2014 :: EVENT
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Mar. 17, 2015 :: EVENT

Apr 16 2003 Cascade Microtech's new app note configures its 300mm wafer probing system with the Agilent 4294A for evaluation of ultra-thin gate oxides

Cascade Microtech’s S300 Semiautomatic Probe Station for 300mm wafers combined with the new Agilent Technologies 4294A creates a powerful tool for the design, qualification, quality control, and testing of electronic components. [View more]

Apr 1 2003 Cascade Microtech's 110 GHz Infinity Probe™ sets new industry standard for on-wafer millimeter-wave device charaterization

Cascade Microtech, Inc. announces the expansion of the Infinity ProbeTM series to 110 GHz as part of a millimeter wave characterization and modeling solution. The Infinity Probe series sets a new standard in increased measurement accuracy and repeatability for the device characterization community. [View more]

Apr 1 2003 Cascade Microtech and Agilent Technologies introduce ENA Wafer Calibration™ software for On-Wafer RF Calibration

Cascade Microtech, the world leader in on-wafer device characterization, introduces ENA Wafer Cal, an RF Calibration software package that runs on the Agilent ENA series Network Analyzer. ENA Wafer Cal provides productivity enhancements to ensure RF engineers, in addition to achieving both accurate and repeatable calibrations, can perform the whole procedure up to 10 times faster than using the front panel. [View more]

Oct 8 2002 Cascade Microtech's new Infinity ProbeTM sets new industry standard for on-wafer device characterization to 110 GHz

Cascade Microtech introduces the Infinity Probe, the first on-wafer probe that offers both high-frequency performance, and low stable contact resistance on aluminum pads (typically < 0.1 Ohm). The Infinity Probe sets a new standard in increased measurement accuracy and repeatability for the device characterization and modeling community. The Infinity Probe combines Cascade Microtech's proprietary thin-film technology with coaxial technology. The result is a probe with superior electrical and mechanical performance as compared to conventional RF probes. [View more]

Aug 21 2002 Agilent Technologies and Cascade Microtech offer fully integrated modeling system for semiconductor devices in millimeter-wave applications

Agilent Technologies Inc. (NYSE: A) and Cascade Microtech Inc. today introduced a fully integrated, 110 GHz modeling system that provides measurement accuracy, dynamic range and exceptionally high performance for characterizing semiconductor device models in millimeter-wave applications. [View more]

Jul 17 2002 Cascade Microtech's 300mm high-frequency CV probing solution allows evaluation of ultra-thin gate oxides with unmatched productivity and accuracy

Cascade Microtech’s S300 Semiautomatic Probing Solution for 300mm wafers, combined with the new Agilent Technologies 4294A, provides unmatched productivity and accuracy for advanced CV analysis of deep submicron semiconductors to 110 MHz. [View more]

Jun 4 2002 Cascade Microtech introduces an on-wafer differential/multi-port test system that increases measurement accuracy while reducing modeling and design costs

Cascade Microtech, Inc., the world’s leading developer of advanced on-wafer characterization and modeling test systems for the semiconductor industry, is pleased to announce the introduction of an exciting new differential solution. This turnkey on-wafer solution includes dual high performance characterization probes, a differential ISS (calibration standards), an Agilent ENA Series RF network analyzer and Cascade’s 200mm and 300mm probing systems. This approach enables design engineers to measure the performance of devices and circuits under each of their desired modes of operation, thereby reducing modeling and design cycle times. [View more]

Jun 4 2002 Cascade Microtech introduces an on-wafer millimeter wave device characterization solution that can reduce design cycle time by up to 40%

Cascade Microtech, Inc., the world’s leading provider of advanced on-wafer characterization and modeling test systems for the semiconductor industry is pleased to announce the introduction of an exciting new millimeter wave device characterization solution that can reduce design cycle time by as much as 40%, thus eliminating costly delays in getting products to market. [View more]

Jun 4 2002 Cascade Microtech and Microvue introduce Wavevue Measurement Studio software for accurate on-wafer device characterization

Cascade Microtech, the world leader in on-wafer device characterization, in a continuing effort to provide a complete integrated RF test solution, introduces Wavevue, a test and measurement software package. Wavevue, developed by Microvue, combines the necessary tools to help RF test engineers efficiently characterize an RF semiconductor device. [View more]

Jun 4 2002 Cascade Microtech and Microvue announce strategic partnership to provide on-wafer RF test software that improves design engineer’s productivity

Cascade Microtech, Inc. and Microvue announce a strategic partnership to provide RF test software that significantly improves design engineer’s productivity when characterizing and modeling RF devices on-wafer. [View more]

Apr 15 2002 Cascade Microtech introduces new test fixture for edge-coupled photonic devices

Cascade Microtech, the market leader in on-wafer parametric probing systems, makes probing DC, RF, and optical probing of photonic devices easier than ever with its new photonic test fixture for edge-coupled photonic devices including lasers, modulators, photodetectors, SOAs, waveguides, MEMs and filters. [View more]

Apr 15 2002 Cascade Microtech expands its family of unique lightwave fiber probes for edge-coupled devices

Cascade Microtech’s Lightwave Probe products are a key part of a complete photonic device characterization solution for on-wafer and in-module devices. Probes are available in both vertical and horizontal orientations. The vertically oriented probes are ideal for top-side PIN and Avalanche photodiode (APD) and Vertical Cavity Surface Emitting Laser (VCSEL) characterization. The horizontally oriented Lightwave Probes are optimized for edge photodiodes and laser bars. When used in conjunction with Cascade’s RF/microwave probes, the Lightwave probe family provides at-frequency testing for 40 Gb/s devices and beyond. [View more]

Apr 15 2002 Cascade Microtech’s WinCal 3.1 now Supports Agilent 835X and 836X PNA Series Network Analyzers

Cascade Microtech announces the release of WinCalTM Calibration Software 3.1 which now supports the new Agilent 835x and 836x PNA Series RF Network Analyzers. WinCal 3.1 Calibration Software has also been enhanced with multiple trace display capabilities for comparison of results from more than one RF measurement. In addition, the calibration software integrates with the Agilent HPIB interface card for controlling the instruments. [View more]

Apr 15 2002 Cascade Microtech releases new Edge Series production probe card for advanced broadband, high-speed digital test

Cascade Microtech adds the new Edge Series Pyramid ProbeTM Cards to its product line of thin-film probe cards used for production-level on-wafer testing of fine pitch, high speed, and IC devices. The new Edge Series Pyramid Probe Cards offer an enhanced signal integrity capability. Coplanar waveguide transmission lines on the core and a new ultra-precision core-to-coax interface enables measurements of extremely fast rise times for advanced broadband products and high-speed digital applications. [View more]

Jan 11 2002 Cascade Microtech introduces new probe (DCP-HTR) for precision on-wafer capacitance measurements

Cascade Microtech, the market leader in on-wafer parametric probing systems, introduces the DCP-HTR probe for its AttoGuard® series of parametric wafer probers. A unique probe tip design complements the AttoGuard measurement shield to enable device characterization with very high signal integrity to the device-under-test (DUT). The new probes use the same customer-preferred signal path accessories as Cascade Microtech’s existing probe series. [View more]

Please vist our Press Releases and Current Events pages for more information.

Media Contact:
Laurie Winton
Sr. Marketing Communications Manager
Cascade Microtech, Inc.
(503) 601-1934