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Jun 10 2003 Cascade Microtech announces a next-generation integrated on-wafer device characterization solution to 110 GHz

Cascade Microtech, Inc., the worldwide leader in providing high frequency and parametric on-wafer test solutions, announces a fully integrated on-wafer device characterization solution that provides measurement accuracy and high performance for characterizing semiconductor devices to 110 GHz. This solution enables high-precision measurements up to 110 GHz by combining the new Agilent N5250A 110 GHz PNA series network analyzer with Cascade’s industry leading Summit series of analytical probing systems. [View more]

Jun 10 2003 Cascade Microtech and Microvue announce new IV and CV modules for Wavevue Measurement Studio Software for On-Wafer Test

Cascade Microtech and Microvue announce two new measurement modules for Wavevue Measurement Studio Software, IV and CV, which together with the existing RF, DC and Wafer Modules enables the complete characterization of on-wafer devices. Wavevue is an integral part of a complete Cascade Microtech test system solution for on-wafer device characterization which includes a probe station, probes, positioners, control software, and calibration standards. Wavevue Measurement Studio software integrates all the tasks of calibration, measurement, data collection, data archiving, analysis, comprehensive reporting and export of data into one easy-to-use package. [View more]

Jun 10 2003 Cascade Microtech expands Infinity Probe® series to 110 GHz

Cascade Microtech, Inc., the worldwide leader in providing high frequency and parametric on-wafer test solutions, announces the expansion of the Infinity Probe series to 110 GHz. The Infinity Probe is the first characterization probe that offers both high-frequency performance and low, stable contact resistance on aluminum pads (typically <0.05 Ohms). The contact area of the probe tips is approximately 12 microns x 12 microns, allowing probing of pads that are less than 50 um x 50 um in size. [View more]

Jun 3 2003 Cascade Microtech introduces turnkey differential RF probing solution

Cascade Microtech, offers a complete solution for multiport or differential linear devices and circuits to be characterized to 8.5 GHz. This turnkey solution includes dual high performance characterization probes, a series of dedicated dual ISSs (Impedance Standard Substrate), ENA Wafer CalTM calibration software, an Agilent ENA Series RF network analyzer (E5071B) and Cascade’s probing system. [View more]

May 19 2003 Cascade Microtech announces strategic licensing agreement with Tokyo Seimitsu

Cascade Microtech, Inc., a leading manufacturer of wafer probe cards and probe stations for laboratory-grade parametric testing of semiconductor devices announced today that is has licensed essential RF measurement technology to Tokyo Seimitsu Co., Ltd., a leading supplier of manufacturing equipment and measurement instruments for the semiconductor industry. The technology transfer will lead to faster and more accurate RF testing of advanced semiconductor devices during production, including high-speed telecommunications and wireless devices. [View more]

Apr 16 2003 Cascade Microtech's new app note configures its 300mm wafer probing system with the Agilent 4294A for evaluation of ultra-thin gate oxides

Cascade Microtech’s S300 Semiautomatic Probe Station for 300mm wafers combined with the new Agilent Technologies 4294A creates a powerful tool for the design, qualification, quality control, and testing of electronic components. [View more]

Apr 1 2003 Cascade Microtech's 110 GHz Infinity Probe™ sets new industry standard for on-wafer millimeter-wave device charaterization

Cascade Microtech, Inc. announces the expansion of the Infinity ProbeTM series to 110 GHz as part of a millimeter wave characterization and modeling solution. The Infinity Probe series sets a new standard in increased measurement accuracy and repeatability for the device characterization community. [View more]

Apr 1 2003 Cascade Microtech and Agilent Technologies introduce ENA Wafer Calibration™ software for On-Wafer RF Calibration

Cascade Microtech, the world leader in on-wafer device characterization, introduces ENA Wafer Cal, an RF Calibration software package that runs on the Agilent ENA series Network Analyzer. ENA Wafer Cal provides productivity enhancements to ensure RF engineers, in addition to achieving both accurate and repeatable calibrations, can perform the whole procedure up to 10 times faster than using the front panel. [View more]

Oct 8 2002 Cascade Microtech's new Infinity ProbeTM sets new industry standard for on-wafer device characterization to 110 GHz

Cascade Microtech introduces the Infinity Probe, the first on-wafer probe that offers both high-frequency performance, and low stable contact resistance on aluminum pads (typically < 0.1 Ohm). The Infinity Probe sets a new standard in increased measurement accuracy and repeatability for the device characterization and modeling community. The Infinity Probe combines Cascade Microtech's proprietary thin-film technology with coaxial technology. The result is a probe with superior electrical and mechanical performance as compared to conventional RF probes. [View more]

Aug 21 2002 Agilent Technologies and Cascade Microtech offer fully integrated modeling system for semiconductor devices in millimeter-wave applications

Agilent Technologies Inc. (NYSE: A) and Cascade Microtech Inc. today introduced a fully integrated, 110 GHz modeling system that provides measurement accuracy, dynamic range and exceptionally high performance for characterizing semiconductor device models in millimeter-wave applications. [View more]

Jul 17 2002 Cascade Microtech's 300mm high-frequency CV probing solution allows evaluation of ultra-thin gate oxides with unmatched productivity and accuracy

Cascade Microtech’s S300 Semiautomatic Probing Solution for 300mm wafers, combined with the new Agilent Technologies 4294A, provides unmatched productivity and accuracy for advanced CV analysis of deep submicron semiconductors to 110 MHz. [View more]

Jun 4 2002 Cascade Microtech introduces an on-wafer differential/multi-port test system that increases measurement accuracy while reducing modeling and design costs

Cascade Microtech, Inc., the world’s leading developer of advanced on-wafer characterization and modeling test systems for the semiconductor industry, is pleased to announce the introduction of an exciting new differential solution. This turnkey on-wafer solution includes dual high performance characterization probes, a differential ISS (calibration standards), an Agilent ENA Series RF network analyzer and Cascade’s 200mm and 300mm probing systems. This approach enables design engineers to measure the performance of devices and circuits under each of their desired modes of operation, thereby reducing modeling and design cycle times. [View more]

Jun 4 2002 Cascade Microtech introduces an on-wafer millimeter wave device characterization solution that can reduce design cycle time by up to 40%

Cascade Microtech, Inc., the world’s leading provider of advanced on-wafer characterization and modeling test systems for the semiconductor industry is pleased to announce the introduction of an exciting new millimeter wave device characterization solution that can reduce design cycle time by as much as 40%, thus eliminating costly delays in getting products to market. [View more]

Jun 4 2002 Cascade Microtech and Microvue introduce Wavevue Measurement Studio software for accurate on-wafer device characterization

Cascade Microtech, the world leader in on-wafer device characterization, in a continuing effort to provide a complete integrated RF test solution, introduces Wavevue, a test and measurement software package. Wavevue, developed by Microvue, combines the necessary tools to help RF test engineers efficiently characterize an RF semiconductor device. [View more]

Please vist our Press Releases and Current Events pages for more information.

Media Contact:
Laurie Winton
Sr. Marketing Communications Manager
Cascade Microtech, Inc.
(503) 601-1934