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Apr 15 2002 Cascade Microtech releases new Edge Series production probe card for advanced broadband, high-speed digital test

Cascade Microtech adds the new Edge Series Pyramid ProbeTM Cards to its product line of thin-film probe cards used for production-level on-wafer testing of fine pitch, high speed, and IC devices. The new Edge Series Pyramid Probe Cards offer an enhanced signal integrity capability. Coplanar waveguide transmission lines on the core and a new ultra-precision core-to-coax interface enables measurements of extremely fast rise times for advanced broadband products and high-speed digital applications. [View more]

Jan 11 2002 Cascade Microtech introduces new probe (DCP-HTR) for precision on-wafer capacitance measurements

Cascade Microtech, the market leader in on-wafer parametric probing systems, introduces the DCP-HTR probe for its AttoGuard® series of parametric wafer probers. A unique probe tip design complements the AttoGuard measurement shield to enable device characterization with very high signal integrity to the device-under-test (DUT). The new probes use the same customer-preferred signal path accessories as Cascade Microtech’s existing probe series. [View more]

Nov 30 2001 Cascade Microtech announces special version of WinCal™ Calibration Software included with each high frequency probe order

Cascade Microtech announces a major breakthrough in increasing engineers’ productivity and their ability to perform on-wafer RF/Microwave and millimeter-wave measurements. It now ships a version of WinCal, their leading-edge calibration software with each high frequency probe order. [View more]

Nov 30 2001 Cascade Microtech Offers New Technology Kits for Existing Customers of Wafer Test Stations

Cascade Microtech, Inc. announces a major step in productivity for wafer testing in R&D labs. Labs with the popular Summit 12000-Series wafer probing stations can install special kits so the systems can utilize the new technology found in the latest generation control software. These kits include all hardware and software necessary to make the probing stations compatible with the Nucleus 2.1 software. [View more]

Nov 30 2001 Cascade Microtech announces special version of WinCal Calibration Software included with each high frequency probe order

Cascade Microtech announces a major breakthrough in increasing engineers’ productivity and their ability to perform on-wafer RF/Microwave and millimeter-wave measurements. It now ships a version of WinCal, their leading-edge calibration software with each high frequency probe order. [View more]

Nov 15 2001 Cascade Microtech's WinCal 3.0 calibration software for Vector Network Analyzers

Cascade Microtech, Inc. introduces WinCal 3.0 software for calibrating vector network analyzers (VNA). WinCal automates the steps required for calibrating VNA instruments, which reduces the time required for the calibration and improves the resulting accuracy. For example, using the front panel of the VNA to perform a manual SOLT (short, open, load, through) calibration, the worst-case deviation from NIST benchmarks can be as high as 18% at 40 GHz. [View more]

Sep 30 2001 Cascade Microtech expands its family of Unique Lightwave Fiber Probes

Cascade Microtech’s Lightwave Probe products are a key part of a complete photonic device characterization solution for on-wafer and in-module devices. Probes are available in both vertical and horizontal orientations. [View more]

Sep 30 2001 Cascade Microtech offers a solution for on-wafer impedance measurements to 3 GHz that seamlessly interfaces with Agilent's E4991A RF Impedance Analyzer

Cascade Microtech, Inc. announces high-performance microwave probes, precision calibration standards and probe stations that, when combined with Agilent Technologies E4991A RF Impedance/Material Analyzer (with new Option 010 Probe Station Connection Kit), offer a superior on-wafer impedance measurement solution from 1 MHz to 3 GHz. [View more]

Sep 30 2001 Cascade Microtech extends its lead in Photonics Probing Solutions by introducing Edge-Emitting Lasers and Edge-Coupled Photodiodes

Cascade Microtech applies its expertise in discrete and on-wafer measurements to offer a measurement solution for edge-emitting laser bars and discrete devices. [View more]

Sep 30 2001 Cascade Microtech Announces Revolutionary New Probe Station Allowing Backside Access to Photonic Devices

Cascade’s new optical probe station incorporates a novel transparent chuck allowing optical access to both sides of the wafer. This enables optical signal coupling to photodiodes and emitters from all directions, which is essential for doing flip-chip photonic device testing. [View more]

Jul 18 2001 Cascade Microtech's Lightwave Probe is an integral part of a complete characterizatio solution for photonic devices

Cascade Microtech’s Lightwave Probe is a key part of a complete photonic device characterization solution for on-wafer and in-module devices. Its vertical orientation is ideal for PIN and avalanche photodiode (APD) and Vertical Cavity Surface Emitting Laser (VCSEL) characterization. Coupled with Cascade’s RF/microwave probes and WinCalTM Calibration Software, the Lightwave Probe provides at-frequency testing for 40 Gb/s devices and beyond. [View more]

Jul 18 2001 Cascade Microtech's Nucleus Thermal 1.0 Software adds automatic X-Y die stepping for rapid over temperature wafer test

Cascade Microtech, Inc. introduces Nucleus Thermal 1.0 Software that offers automatic “one-step” thermal compensation for accurate X-Y die stepping, as well as precision temperature control, improving parametric test data accuracy and increasing data collection throughput. [View more]

Jul 18 2001 Pyramid Probe Cards Ideal for reducing cost of wafer test

In the current industry climate, semiconductor manufacturers are scrambling to cut costs. Cascade Microtech Inc.'s Pyramid Probe cards reduce the cost of test by increasing equipment throughput (through increased up time) and by testing faster (through multi-DUT testing) thus improving efficiencies of capital and operator time. [View more]

Jul 18 2001 Cascade Microtech's new Multicontact Eye-Pass Probe is designed to provide a multitude of simultaneous connections to a wafer

Cascade Microtech, Inc. announces its new Multicontact Eye-Pass Probe. The probe is designed to provide a multitude of simultaneous connections to a wafer or other similar device. [View more]

Jul 18 2001 Cascade Microtech introduces a probing solution for edge-emitting lasers and VCSELs

Cascade Microtech has applied its expertise in discrete and on-wafer measurements to develop a measurement solution for edge-emitting laser bars and discrete devices. This measurement solution uses newly developed optical fiber probes and large-area photodiodes in conjunction with Cascade’s existing RF and DC probes and probe stations. [View more]

Please vist our Press Releases and Current Events pages for more information.

Media Contact:
Laurie Winton
Sr. Marketing Communications Manager
Cascade Microtech, Inc.
(503) 601-1934