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Dec 14 2004 Cascade Microtech Announces Initial Public Offering

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that it priced its initial public offering of 5,300,000 shares of its common stock at $14.00 per share. Of these shares, the company will issue 3,300,000 shares and existing shareholders will sell an additional 2,000,000 shares in the offering. In addition, the company and the selling shareholders have granted the underwriters an option to purchase up to an additional 795,000 shares to cover over-allotments, if any. [View more]

Jul 14 2004 Cascade Microtech probe stations integrate with Agilent 41000 to speed wafer characterization

Cascade Microtech’s S300 wafer probe stations for 300mm wafer probing and Summit 12000 series probe stations easily integrate with the Agilent 41000 Series, or Integrated Parametric Analysis and Characterization Environment (iPACE). The 41000 Series uses advanced switching matrix technology and supports a new atto sense and switch unit (ASU) that enables automation of parametric instruments without compromising measurement performance. [View more]

Jul 8 2004 Automatic Wafer Alignment available on Cascade Microtech Probe Stations

Cascade Microtech, Inc., announces a fast and easy way to align wafers and RF calibration substrates with Nucleus VisionTM 3.0 Software. Nucleus Vision 3.0 Software eliminates die-stepping errors when using small pads and increases good test data collection. These automation tools enable faster test set up and throughput and thus more accurate data collection that gets products to market faster. [View more]

Jul 4 2004 Summit 12000-Series Probe Stations now ship with high-resolution motorized theta as standard

Cascade Microtech, Inc., announces the availability of the motorized theta for all Sumit 12000-Series Probe Stations. All Summit B 12000-Series Probe Stations now include motorized theta as a standard feature along with 2-point alignment. Upgrade kits available for older Summit 12000-Series probe stations. [View more]

Jul 4 2004 Summit 12000-Series Probe Stations now ship with high-resolution motorized theta as standard

Cascade Microtech, Inc., announces the availability of the motorized theta for all Sumit 12000-Series Probe Stations. All Summit B 12000-Series Probe Stations now include motorized theta as a standard feature along with 2-point alignment. Upgrade kits available for older Summit 12000-Series probe stations. [View more]

Jun 8 2004 Cascade Microtech's Nucleus™ 3.0 Prober Control Software provides new productivity enhancing tools

Cascade Microtech, Inc., releases Nucleus 3.0 Probe Station Control Software. Nucleus 3.0 Software controls Cascade’s S300 (300mm wafer probing) and Summit / Alessi Series Probe Stations (200mm). The new software enhances on-wafer probing applications for RF & DC/CV, failure analysis, design debug and general purpose probing. It’s a cost-effective tool that is easy to use. [View more]

Jun 8 2004 Automatic Wafer Alignment available on Cascade Microtech Probe Stations

Cascade Microtech, Inc., announces a fast and easy way to align wafers and RF calibration substrates with Nucleus VisionTM 3.0 Software. Nucleus Vision 3.0 Software eliminates die-stepping errors when using small pads and increases good test data collection. These automation tools enable faster test set up and throughput and thus more accurate data collection that gets products to market faster. [View more]

Mar 4 2004 Cascade Microtech, Inc. files registration statement with the SEC for an Initial Public Offering

Cascade Microtech, Inc. announced today that it has filed a registration statement for the proposed initial public offering of its common stock with the Securities and Exchange Commission. [View more]

Sep 11 2003 Cascade Microtech opens regional office in Singapore

Cascade Microtech, Inc., the industry leader in high-frequency and parametric on-wafer test solutions, announced today the opening of a new office in Singapore. Cascade Microtech Singapore is responsible for direct sales, service, and support of products for Cascade’s Engineering Product Division (EPD) in Singapore and Malaysia. [View more]

Jul 16 2003 Cascade Microtech announces a new high performance 300mm Thermal Probe Station

Cascade Microtech, Inc., announces a series of 300mm semiautomatic and manual S300 Probing Stations that utilize the ERS AirCool + high performance thermal system. The new stations are available with an integrated AirCool + chuck (–55 to 200°C range) or AirCool + chuck (0 to 300°C range). [View more]

Jul 16 2003 Cascade Microtech Announces a Major Upgrade to the Best-Selling Summit Series Analytical Wafer Probe Station

Cascade Microtech, Inc., announces a new series of 200mm semiautomatic and manual Summit Probe Stations. The Summit B series is a major upgrade to Cascade’s existing Summit 11000 and 12000 series which are the industries’ best-selling analytical probe stations. The “B” series provide enhanced upgradability, new probing capability, and improved usability. [View more]

Jul 16 2003 Cascade Microtech Announces Production Availability of Consumer RF Pyramid Probe® Cards for Functional Manufacturing Wafer Test

Cascade Microtech, Inc., a leading supplier of probes, test stations and accessories for semiconductor wafer-testing, announced today the production availability of its family of high-performance, fine-pitch Consumer RF Pyramid Probe Cards for in-line manufacturing. Consumer RF semiconductors are used in many familiar applications such as cell phones, WiFi, Blue-tooth, and wireless local-area networks. [View more]

Jul 16 2003 Cascade Microtech Announces Production Availability of DC Parametric Pyramid Probe Cards to Enable More Die per Wafer

Cascade Microtech, Inc., a leading supplier of probes, test stations and accessories for semiconductor wafer-testing, announced today the production availability of its high-performance, fine-pitch DC Parametric Pyramid Probe cards. [View more]

Jun 10 2003 Cascade Microtech introduces a new series of 4-port calibration standards for use to 50 GHz

Cascade Microtech, Inc., introduces a dedicated family of calibration standards for dual high frequency probes. The initial introduction is for GSGSG probe configurations with pitch between 100-250 µm. [View more]

Please vist our Press Releases and Current Events pages for more information.

Media Contact:
Laurie Winton
Sr. Marketing Communications Manager
Cascade Microtech, Inc.
(503) 601-1934